Inventor
CHEN PU-FANG
TW19 patents
⚠️ This page may combine multiple inventors who share the name “CHEN PU-FANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
13 patentsUS10714433B2Jul 14, 2020
Semiconductor structure and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations70
US12046614B2Jul 23, 2024
Apparatus and methods for effective impurity gettering
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12387943B2Aug 12, 2025
Structure for embedded gettering in a silicon on insulator wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12040221B2Jul 16, 2024
Fabrication method of metal-free SOI wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11232974B2Jan 25, 2022
Fabrication method of metal-free SOI wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11211259B2Dec 28, 2021
Structure and method for embedded gettering in a silicon on insulator wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11508670B2Nov 22, 2022
Semiconductor structure and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US9064823B2Jun 23, 2015
Method for qualifying a semiconductor wafer for subsequent processing
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations58
US10157819B2Dec 18, 2018
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations51
US9899297B1Feb 20, 2018
Semiconductor device having a through-silicon via and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations51
US10170312B2Jan 1, 2019
Semiconductor substrate and manufacturing method of the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations45
US10141413B2Nov 27, 2018
Wafer strength by control of uniformity of edge bulk micro defects
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations37
US10190235B2Jan 29, 2019
Wafer supporting structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations28
TAIWAN SEMICONDUCTOR MFG
4 patentsUS6646752B2Nov 11, 2003
Method and apparatus for measuring thickness of a thin oxide layer
TAIWAN SEMICONDUCTOR MFG34 citations85
US8008158B2Aug 30, 2011
Dopant implantation method using multi-step implants
TAIWAN SEMICONDUCTOR MFG17 citations79
US7713852B2May 11, 2010
Methods for forming field effect transistors and EPI-substrate
TAIWAN SEMICONDUCTOR MFG2 citations61
US7518129B2Apr 14, 2009
Preventing dosage drift with duplicate dose integrators
TAIWAN SEMICONDUCTOR MFG0 citations48