Inventor
ANGELOTTI FRANK WILLIAM
US4 patents
Patents
4 patentsUS5717701AFeb 10, 1998
Apparatus and method for testing interconnections between semiconductor devices
IBM98 citations96
US6807645B2Oct 19, 2004
Method and apparatus for implementing enhanced LBIST diagnostics of intermittent failures
IBM66 citations94
US5757820AMay 26, 1998
Method for testing interconnections between integrated circuits using a dynamically generated interconnect topology model
IBM25 citations89
US5909452AJun 1, 1999
Method for avoiding contention during boundary scan testing
IBM13 citations70