Inventor · disambiguated record
John Joseph Salazar
Also filed as: SALAZAR JOHN JOSEPH
11 granted patents·57 citations·filing 2003–2013
87Inventor score
Top patents by PatentIndex Score
11 records- 0196US7453279B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Nov 18, 2008·30 cites·6 claims
- 0280US6911836B2Apparatus for functional and stress testing of exposed chip land grid array devicesIBM·Filed 2003·Granted Jun 28, 2005·26 cites·18 claims
- 0359US7479796B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Jan 20, 2009·1 cites·14 claims
- 0447US7466155B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Dec 16, 2008·0 cites·7 claims
- 0547US7463017B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Dec 9, 2008·0 cites·3 claims
- 0647US7456644B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Nov 25, 2008·0 cites·5 claims
- 0747US7425822B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Sep 16, 2008·0 cites·1 claims
- 0847US7423440B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Sep 9, 2008·0 cites·6 claims
- 0947US7405583B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Jul 29, 2008·0 cites·1 claims
- 1046US9916480B2Security apparatus to house a deviceTREND MICRO INC·Filed 2013·Granted Mar 13, 2018·0 cites·13 claims
- 1145US7352200B2Functional and stress testing of LGA devicesIBM·Filed 2005·Granted Apr 1, 2008·0 cites·14 claims
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