P

Inventor

ANDERSON DIRK N

US18 patents
⚠️ This page may combine multiple inventors who share the name “ANDERSON DIRK N”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TEXAS INSTRUMENTS INC

17 patents
US5796151AAug 18, 1998

Semiconductor stack having a dielectric sidewall for prevention of oxidation of tungsten in tungsten capped poly-silicon gate electrodes

TEXAS INSTRUMENTS INC112 citations98
US5300447AApr 5, 1994

Method of manufacturing a minimum scaled transistor

TEXAS INSTRUMENTS INC158 citations98
US6245605B1Jun 12, 2001

Method to protect metal from oxidation during poly-metal gate formation in semiconductor device manufacturing

TEXAS INSTRUMENTS INC62 citations96
US6100188AAug 8, 2000

Stable and low resistance metal/barrier/silicon stack structure and related process for manufacturing

TEXAS INSTRUMENTS INC55 citations96
US6187656B1Feb 13, 2001

CVD-based process for manufacturing stable low-resistivity poly-metal gate electrodes

TEXAS INSTRUMENTS INC58 citations94
US6720247B2Apr 13, 2004

Pre-pattern surface modification for low-k dielectrics using A H2 plasma

TEXAS INSTRUMENTS INC48 citations92
US6380008B2Apr 30, 2002

Edge stress reduction by noncoincident layers

TEXAS INSTRUMENTS INC39 citations92
US6159835ADec 12, 2000

Encapsulated low resistance gate structure and method for forming same

TEXAS INSTRUMENTS INC30 citations92
US4808552AFeb 28, 1989

Process for making vertically-oriented interconnections for VLSI devices

TEXAS INSTRUMENTS INC49 citations92
US4751198AJun 14, 1988

Process for making contacts and interconnections using direct-reacted silicide

TEXAS INSTRUMENTS INC20 citations82
US6559050B1May 6, 2003

Process for high thermal stable contact formation in manufacturing sub-quarter-micron CMOS devices

TEXAS INSTRUMENTS INC7 citations73
US6373088B2Apr 16, 2002

Edge stress reduction by noncoincident layers

TEXAS INSTRUMENTS INC10 citations73
US4922320AMay 1, 1990

Integrated circuit metallization with reduced electromigration

TEXAS INSTRUMENTS INC13 citations73
US4744858AMay 17, 1988

Integrated circuit metallization with reduced electromigration

TEXAS INSTRUMENTS INC13 citations73
US4589196AMay 20, 1986

Contacts for VLSI devices using direct-reacted silicide

TEXAS INSTRUMENTS INC19 citations73
US5216265AJun 1, 1993

Integrated circuit memory devices with high angle implant around top of trench to reduce gated diode leakage

TEXAS INSTRUMENTS INC10 citations68
US6861348B2Mar 1, 2005

Pre-pattern surface modification of low-k dielectrics

TEXAS INSTRUMENTS INC1 citations51

ANDERSON DIRK N

1 patent