Inventor · disambiguated record
Noritomo Mitsugi
Also filed as: MITSUGI NORITOMO
5 granted patents·2 pending applications·4 citations·filing 2010–2022
65Inventor score
Top patents by PatentIndex Score
7 records- 0167US8173523B2Method of removing heavy metal in semiconductor substrateMITSUGI NORITOMO·Filed 2010·Granted May 8, 2012·3 cites·7 claims
- 0260US9842779B2Method of evaluating metal contamination in semiconductor wafer and method of manufacturing semiconductor waferSUMCO CORP·Filed 2014·Granted Dec 12, 2017·1 cites·8 claims
- 0352US2025327760A1Method of evaluating semiconductor sample, evaluation device of semiconductor sample and method of manufacturing semiconductor waferSUMCO CORP·Filed 2022·Application pending·0 cites
- 0448US10935510B2Method of measuring carbon concentration of silicon sample, method of manufacturing silicon single crystal ingot, silicon single crystal ingot and silicon waferSUMCO CORP·Filed 2017·Granted Mar 2, 2021·0 cites·15 claims
- 0547US11183433B2Method of evaluating silicon layer and a method of manufacturing silicon epitaxial waferSUMCO CORP·Filed 2019·Granted Nov 23, 2021·0 cites·8 claims
- 0646US2024344951A1Method of measuring contact angle of silicon wafer and method of evaluating surface condition of silicon waferSUMCO CORP·Filed 2022·Application pending·0 cites
- 0743US10676840B2Method of evaluating manufacturing process of silicon material and manufacturing method of silicon materialSUMCO CORP·Filed 2017·Granted Jun 9, 2020·0 cites·9 claims
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