Inventor
CARDER DARRELL L
US5 patents
Patents
5 patentsUS7725788B2May 25, 2010
Method and apparatus for secure scan testing
FREESCALE SEMICONDUCTOR INC18 citations88
US7185249B2Feb 27, 2007
Method and apparatus for secure scan testing
FREESCALE SEMICONDUCTOR INC40 citations88
US7346820B2Mar 18, 2008
Testing of data retention latches in circuit devices
FREESCALE SEMICONDUCTOR INC12 citations80
US9366724B1Jun 14, 2016
Scan testing with staggered clocks
FREESCALE SEMICONDUCTOR INC8 citations79
US9069042B2Jun 30, 2015
Efficient apparatus and method for testing digital shadow logic around non-logic design structures
FREESCALE SEMICONDUCTOR INC3 citations60