Inventor
KITAMURA TADASHI
JP26 patents
⚠️ This page may combine multiple inventors who share the name “KITAMURA TADASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUI CHEMICALS INC
6 patentsUS6555187B1Apr 29, 2003
Sealing material composition for liquid crystal
MITSUI CHEMICALS INC61 citations96
US6913798B2Jul 5, 2005
Sealing material for plastic liquid crystal display cells including two-component epoxy resin composition
MITSUI CHEMICALS INC34 citations92
US6812065B1Nov 2, 2004
Anisotropic conductive paste
MITSUI CHEMICALS INC46 citations92
US7903230B2Mar 8, 2011
Method for producing liquid crystal display cell and sealing agent for liquid crystal display cell
MITSUI CHEMICALS INC8 citations84
US7541075B2Jun 2, 2009
Sealant material for plastic liquid crystal display cells including one component epoxy resin composition
MITSUI CHEMICALS INC4 citations62
US7566377B2Jul 28, 2009
Liquid crystal sealing agent composition and manufacturing method of liquid crystal display panel using the same
MITSUI CHEMICALS INC3 citations60
MITSUI TOATSU CHEMICALS
5 patentsUS4122143AOct 24, 1978
Process for producing cured products
MITSUI TOATSU CHEMICALS38 citations88
US4387115AJun 7, 1983
Composition for conductive cured product
MITSUI TOATSU CHEMICALS22 citations82
US5095059AMar 10, 1992
Oiled-face adherable, hot-melt adhesive composition and a non-slip processing method of metal scaffolding board
MITSUI TOATSU CHEMICALS19 citations79
US5633317AMay 27, 1997
Isocyanate resin compositions and hot melt and pressure sensitive adhesives based thereon
MITSUI TOATSU CHEMICALS12 citations71
US5418288AMay 23, 1995
Isocyanate resin compositions and hot melt and pressure sensitive adhesives based thereon
MITSUI TOATSU CHEMICALS14 citations71
KITAMURA TADASHI
4 patentsUS8422761B2Apr 16, 2013
Defect and critical dimension analysis systems and methods for a semiconductor lithographic process
KITAMURA TADASHI12 citations83
US8150140B2Apr 3, 2012
System and method for a semiconductor lithographic process control using statistical information in defect identification
KITAMURA TADASHI15 citations83
US8285031B2Oct 9, 2012
Pattern inspection apparatus and method
KITAMURA TADASHI11 citations79
US9189843B2Nov 17, 2015
Pattern inspection apparatus and method
KITAMURA TADASHI4 citations68
NANOGEOMETRY RES INC
3 patentsUS7796801B2Sep 14, 2010
Pattern inspection apparatus and method
NANOGEOMETRY RES INC81 citations95
US7817844B2Oct 19, 2010
Pattern inspection apparatus and method
NANOGEOMETRY RES INC47 citations92
US7660455B2Feb 9, 2010
Pattern inspection apparatus, pattern inspection method, and recording medium
NANOGEOMETRY RES INC24 citations92
SEIKO INSTR INC
3 patentsUS6399953B1Jun 4, 2002
Scanning electronic microscope and method for automatically observing semiconductor wafer
SEIKO INSTR INC31 citations92
US5444245AAug 22, 1995
Method of automatically setting coordinate conversion factor
SEIKO INSTR INC16 citations74
US5477049ADec 19, 1995
Particle analysis method
SEIKO INSTR INC6 citations63