Inventor
BUCZKOWSKI ANDRZEJ
US11 patents
⚠️ This page may combine multiple inventors who share the name “BUCZKOWSKI ANDRZEJ”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NANOMETRICS INC
3 patentsUS7446321B2Nov 4, 2008
Differential wavelength photoluminescence for non-contact measuring of contaminants and defects located below the surface of a wafer or other workpiece
NANOMETRICS INC13 citations82
US9846122B2Dec 19, 2017
Optical metrology system for spectral imaging of a sample
NANOMETRICS INC3 citations63
US9182351B2Nov 10, 2015
Optical metrology system for spectral imaging of a sample
NANOMETRICS INC2 citations61