Inventor

NOEL LEO A

US3 patents

Patents

3 patents

US6618682B2Sep 9, 2003

Method for test optimization using historical and actual fabrication test data

IBM88 citations95

US6260163B1Jul 10, 2001

Testing high I/O integrated circuits on a low I/O tester

IBM25 citations89

US6078189AJun 20, 2000

Dynamic test reordering

IBM49 citations88