Inventor
BAR-OR RON
IL3 patents
Patents
3 patentsUS11662324B1May 30, 2023
Three-dimensional surface metrology of wafers
APPLIED MATERIALS ISRAEL LTD2 citations66
US9835563B2Dec 5, 2017
Evaluation system and a method for evaluating a substrate
APPLIED MATERIALS ISRAEL LTD0 citations49
US10446434B2Oct 15, 2019
Chuck for supporting a wafer
APPLIED MATERIALS ISRAEL LTD0 citations39