Inventor
DUESMAN KEVIN G
US113 patents
⚠️ This page may combine multiple inventors who share the name “DUESMAN KEVIN G”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
49 patentsUS6858891B2Feb 22, 2005
Nanotube semiconductor devices and methods for making the same
MICRON TECHNOLOGY INC124 citations99
US6794699B2Sep 21, 2004
Annular gate and technique for fabricating an annular gate
MICRON TECHNOLOGY INC172 citations99
US6515325B1Feb 4, 2003
Nanotube semiconductor devices and methods for making the same
MICRON TECHNOLOGY INC175 citations99
US6482576B1Nov 19, 2002
Surface smoothing of stereolithographically formed 3-D objects
MICRON TECHNOLOGY INC116 citations99
US5824569AOct 20, 1998
Semiconductor device having ball-bonded pads
MICRON TECHNOLOGY INC123 citations99
US5324681AJun 28, 1994
Method of making a 3-dimensional programmable antifuse for integrated circuits
MICRON TECHNOLOGY INC144 citations99
US5110754AMay 5, 1992
Method of making a DRAM capacitor for use as an programmable antifuse for redundancy repair/options on a DRAM
MICRON TECHNOLOGY INC226 citations99
US7205598B2Apr 17, 2007
Random access memory device utilizing a vertically oriented select transistor
MICRON TECHNOLOGY INC60 citations98
US6562278B1May 13, 2003
Methods of fabricating housing structures and micromachines incorporating such structures
MICRON TECHNOLOGY INC91 citations98
US5977763ANov 2, 1999
Circuit and method for measuring and forcing an internal voltage of an integrated circuit
MICRON TECHNOLOGY INC101 citations98
US6731528B2May 4, 2004
Dual write cycle programmable conductor memory system and method of operation
MICRON TECHNOLOGY INC116 citations97
US6605956B2Aug 12, 2003
Device and method for testing integrated circuit dice in an integrated circuit module
MICRON TECHNOLOGY INC70 citations96
US6240535B1May 29, 2001
Device and method for testing integrated circuit dice in an integrated circuit module
MICRON TECHNOLOGY INC40 citations96
US6088282AJul 11, 2000
System and method for an antifuse bank
MICRON TECHNOLOGY INC65 citations96
US6078100AJun 20, 2000
Utilization of die repattern layers for die internal connections
MICRON TECHNOLOGY INC46 citations96
US6043564AMar 28, 2000
Semiconductor device having ball-bonded pads
MICRON TECHNOLOGY INC67 citations96
US5825697AOct 20, 1998
Circuit and method for enabling a function in a multiple memory device module
MICRON TECHNOLOGY INC56 citations96
US5796746AAug 18, 1998
Device and method for testing integrated circuit dice in an integrated circuit module
MICRON TECHNOLOGY INC81 citations96
US5724282AMar 3, 1998
System and method for an antifuse bank
MICRON TECHNOLOGY INC66 citations96
US5266821ANov 30, 1993
Chip decoupling capacitor
MICRON TECHNOLOGY INC99 citations96
US6319756B2Nov 20, 2001
Heat sink for chip stacking applications
MICRON TECHNOLOGY INC38 citations95
US6031727AFeb 29, 2000
Printed circuit board with integrated heat sink
MICRON TECHNOLOGY INC61 citations95
US5307309AApr 26, 1994
Memory module having on-chip surge capacitors
MICRON TECHNOLOGY INC76 citations94
US5032892AJul 16, 1991
Depletion mode chip decoupling capacitor
MICRON TECHNOLOGY INC68 citations94
US7081385B2Jul 25, 2006
Nanotube semiconductor devices and methods for making the same
MICRON TECHNOLOGY INC21 citations93
US6893804B2May 17, 2005
Surface smoothing of stereolithographically formed 3-D objects
MICRON TECHNOLOGY INC12 citations93
US6797545B2Sep 28, 2004
Method and apparatus for fabricating electronic device
MICRON TECHNOLOGY INC27 citations93
US6740476B2May 25, 2004
Surface smoothing of stereolithographically formed 3-D objects
MICRON TECHNOLOGY INC19 citations93
US6709795B2Mar 23, 2004
Stereolithographically packaged, in-process semiconductor die
MICRON TECHNOLOGY INC20 citations93
US6632343B1Oct 14, 2003
Method and apparatus for electrolytic plating of surface metals
MICRON TECHNOLOGY INC30 citations93
US6544465B1Apr 8, 2003
Method for forming three dimensional structures from liquid with improved surface finish
MICRON TECHNOLOGY INC32 citations93
US6331736B1Dec 18, 2001
Utilization of die repattern layers for die internal connections
MICRON TECHNOLOGY INC17 citations93
US6326245B1Dec 4, 2001
Method and apparatus for fabricating electronic device
MICRON TECHNOLOGY INC27 citations93
US6169695B1Jan 2, 2001
Method and apparatus for rapidly testing memory devices
MICRON TECHNOLOGY INC18 citations93
US6124163ASep 26, 2000
Integrated chip multiplayer decoupling capacitors
MICRON TECHNOLOGY INC20 citations93
US6093933AJul 25, 2000
Method and apparatus for fabricating electronic device
MICRON TECHNOLOGY INC29 citations93
US6002590ADec 14, 1999
Flexible trace surface circuit board and method for making flexible trace surface circuit board
MICRON TECHNOLOGY INC32 citations93
US5991904ANov 23, 1999
Method and apparatus for rapidly testing memory devices
MICRON TECHNOLOGY INC19 citations93
US5787044AJul 28, 1998
Memory-cell array and a method for repairing the same
MICRON TECHNOLOGY INC24 citations93
US5739576AApr 14, 1998
Integrated chip multilayer decoupling capacitors
MICRON TECHNOLOGY INC24 citations93
US5677878AOct 14, 1997
Method and apparatus for quickly restoring digit I/O lines
MICRON TECHNOLOGY INC23 citations93
US10128229B1Nov 13, 2018
Semiconductor devices with package-level configurability
MICRON TECHNOLOGY INC12 citations92
US7777264B2Aug 17, 2010
Random access memory device utilizing a vertically oriented select transistor
MICRON TECHNOLOGY INC15 citations92
US7034560B2Apr 25, 2006
Device and method for testing integrated circuit dice in an integrated circuit module
MICRON TECHNOLOGY INC20 citations92
US6841438B2Jan 11, 2005
Annular gate and technique for fabricating an annular gate
MICRON TECHNOLOGY INC27 citations92
US6356474B1Mar 12, 2002
Efficient open-array memory device architecture and method
MICRON TECHNOLOGY INC31 citations92
US5687109ANov 11, 1997
Integrated circuit module having on-chip surge capacitors
MICRON TECHNOLOGY INC23 citations92
US7142446B2Nov 28, 2006
Apparatus and method to reduce undesirable effects caused by a fault in a memory device
MICRON TECHNOLOGY INC15 citations91
US6230292B1May 8, 2001
Devices and method for testing cell margin of memory devices
MICRON TECHNOLOGY INC25 citations91
MICRON SEMICONDUCTOR INC
1 patentShowing the top 50 of 113 patents by PatentIndex Score.