Inventor
STUBBS ERIC T
US39 patents
Patents
39 patentsUS6947341B2Sep 20, 2005
Integrated semiconductor memory chip with presence detect data capability
MICRON TECHNOLOGY INC74 citations98
US6388480B1May 14, 2002
Method and apparatus for reducing the lock time of DLL
MICRON TECHNOLOGY INC87 citations98
US6791381B2Sep 14, 2004
Method and apparatus for reducing the lock time of a DLL
MICRON TECHNOLOGY INC49 citations96
US6727739B2Apr 27, 2004
Compensation for a delay locked loop
MICRON TECHNOLOGY INC60 citations96
US6636093B1Oct 21, 2003
Compensation for a delay locked loop
MICRON TECHNOLOGY INC55 citations96
US6286115B1Sep 4, 2001
On-chip testing circuit and method for integrated circuits
MICRON TECHNOLOGY INC69 citations96
US6028799AFeb 22, 2000
Memory circuit voltage regulator
MICRON TECHNOLOGY INC17 citations96
US7116589B2Oct 3, 2006
Per-bit set-up and hold time adjustment for double-data rate synchronous DRAM
MICRON TECHNOLOGY INC13 citations92
US6959062B1Oct 25, 2005
Variable delay line
MICRON TECHNOLOGY INC31 citations92
US6862224B2Mar 1, 2005
System and method for operating a memory array
MICRON TECHNOLOGY INC23 citations92
US6838712B2Jan 4, 2005
Per-bit set-up and hold time adjustment for double-data rate synchronous DRAM
MICRON TECHNOLOGY INC19 citations92
US6625692B1Sep 23, 2003
Integrated semiconductor memory chip with presence detect data capability
MICRON TECHNOLOGY INC20 citations92
US6570258B2May 27, 2003
Method for reducing capacitive coupling between conductive lines
MICRON TECHNOLOGY INC25 citations92
US5923672AJul 13, 1999
Multipath antifuse circuit
MICRON TECHNOLOGY INC27 citations92
US5854128ADec 29, 1998
Method for reducing capacitive coupling between conductive lines
MICRON TECHNOLOGY INC17 citations92
US5877993AMar 2, 1999
Memory circuit voltage regulator
MICRON TECHNOLOGY INC16 citations86
US6581174B2Jun 17, 2003
On-chip testing circuit and method for integrated circuits
MICRON TECHNOLOGY INC15 citations84
US6778452B2Aug 17, 2004
Circuit and method for voltage regulation in a semiconductor device
MICRON TECHNOLOGY INC6 citations82
US6052322AApr 18, 2000
Memory circuit voltage regulator
MICRON TECHNOLOGY INC6 citations82
US6011731AJan 4, 2000
Cell plate regulator
MICRON TECHNOLOGY INC7 citations82
US7274605B2Sep 25, 2007
Per-bit set-up and hold time adjustment for double-data rate synchronous DRAM
MICRON TECHNOLOGY INC7 citations74
US7152143B2Dec 19, 2006
Integrated semiconductor memory chip with presence detect data capability
MICRON TECHNOLOGY INC6 citations74
US6898144B2May 24, 2005
Actively driven VREF for input buffer noise immunity
MICRON TECHNOLOGY INC4 citations74
US6181617B1Jan 30, 2001
Method and apparatus for testing a semiconductor device
MICRON TECHNOLOGY INC2 citations74
US5982687ANov 9, 1999
Method of detecting leakage within a memory cell capacitor
MICRON TECHNOLOGY INC3 citations74
US6259162B1Jul 10, 2001
Method for reducing capactive coupling between conductive lines
MICRON TECHNOLOGY INC5 citations73
US6882587B2Apr 19, 2005
Method of preparing to test a capacitor
MICRON TECHNOLOGY INC0 citations63
US6600687B2Jul 29, 2003
Method of compensating for a defect within a semiconductor device
MICRON TECHNOLOGY INC0 citations63
US6597619B2Jul 22, 2003
Actively driven VREF for input buffer noise immunity
MICRON TECHNOLOGY INC4 citations63
US6469944B2Oct 22, 2002
Method of compensating for a defect within a semiconductor device
MICRON TECHNOLOGY INC0 citations63
US6445629B2Sep 3, 2002
Method of stressing a memory device
MICRON TECHNOLOGY INC0 citations63
US6418071B2Jul 9, 2002
Method of testing a memory cell
MICRON TECHNOLOGY INC0 citations63
US6353564B1Mar 5, 2002
Method of testing a memory array
MICRON TECHNOLOGY INC0 citations63
US6226210B1May 1, 2001
Method of detecting a short from a digit line pair to ground
MICRON TECHNOLOGY INC0 citations63
US6198676B1Mar 6, 2001
Test device
MICRON TECHNOLOGY INC0 citations63
US6188622B1Feb 13, 2001
Method of identifying a defect within a memory circuit
MICRON TECHNOLOGY INC1 citations63
US6026040AFeb 15, 2000
Method of altering the margin affecting a memory cell
MICRON TECHNOLOGY INC1 citations63
US7400544B2Jul 15, 2008
Actively driven VREF for input buffer noise immunity
MICRON TECHNOLOGY INC0 citations52
US6667911B2Dec 23, 2003
High speed memory architecture
MICRON TECHNOLOGY INC0 citations52