P

Inventor

OHKUBO HIROAKI

JP54 patents
⚠️ This page may combine multiple inventors who share the name “OHKUBO HIROAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NEC ELECTRONICS CORP

25 patents
US6635912B2Oct 21, 2003

CMOS image sensor and manufacturing method thereof

NEC ELECTRONICS CORP115 citations98
US6841843B2Jan 11, 2005

Semiconductor integrated circuit device

NEC ELECTRONICS CORP29 citations93
US6639293B2Oct 28, 2003

Solid-state imaging device

NEC ELECTRONICS CORP32 citations93
US6879234B2Apr 12, 2005

Semiconductor integrated circuit

NEC ELECTRONICS CORP29 citations92
US7256456B2Aug 14, 2007

SOI substrate and semiconductor integrated circuit device

NEC ELECTRONICS CORP13 citations84
US7091576B2Aug 15, 2006

Inductor for semiconductor integrated circuit and method of fabricating the same

NEC ELECTRONICS CORP14 citations84
US6806522B2Oct 19, 2004

CMOS image sensor and manufacturing method for the same

NEC ELECTRONICS CORP16 citations84
US7030919B2Apr 18, 2006

Solid state image pick-up device

NEC ELECTRONICS CORP6 citations74
US6849913B2Feb 1, 2005

Integrated circuit including an inductor, active layers with isolation dielectrics, and multiple insulation layers

NEC ELECTRONICS CORP10 citations74
US6707116B2Mar 16, 2004

Integrated circuit and manufacturing method therefor

NEC ELECTRONICS CORP7 citations74
US6576882B2Jun 10, 2003

Image sensor

NEC ELECTRONICS CORP9 citations74
US7800668B2Sep 21, 2010

Solid state imaging device including a light receiving portion with a silicided surface

NEC ELECTRONICS CORP3 citations63
US7579673B2Aug 25, 2009

Semiconductor device having electrical fuse

NEC ELECTRONICS CORP2 citations63
US7544940B2Jun 9, 2009

Semiconductor device including vanadium oxide sensor element with restricted current density

NEC ELECTRONICS CORP2 citations63
US7432170B2Oct 7, 2008

Semiconductor device and fabrication method thereof

NEC ELECTRONICS CORP5 citations63
US7417277B2Aug 26, 2008

Semiconductor integrated circuit and method of manufacturing the same

NEC ELECTRONICS CORP6 citations63
US7345347B2Mar 18, 2008

Semiconductor device

NEC ELECTRONICS CORP6 citations63
US7288826B2Oct 30, 2007

Semiconductor integrated circuit device

NEC ELECTRONICS CORP3 citations63
US7211870B2May 1, 2007

Semiconductor device

NEC ELECTRONICS CORP2 citations63
US7095072B2Aug 22, 2006

Semiconductor device with wiring layers forming a capacitor

NEC ELECTRONICS CORP6 citations63
US7741692B2Jun 22, 2010

Integrated circuit device with temperature monitor members

NEC ELECTRONICS CORP2 citations62
US7391092B2Jun 24, 2008

Integrated circuit including a temperature monitor element and thermal conducting layer

NEC ELECTRONICS CORP5 citations62
US7777298B2Aug 17, 2010

Semiconductor device and method of manufacturing the same

NEC ELECTRONICS CORP0 citations52
US7498626B2Mar 3, 2009

Semiconductor device and method of manufacturing the same

NEC ELECTRONICS CORP0 citations52
US7432545B2Oct 7, 2008

Semiconductor device

NEC ELECTRONICS CORP1 citations52

NEC CORP

13 patents

OHKUBO HIROAKI

6 patents

RENESAS ELECTRONICS CORP

4 patents

FURUMIYA MASAYUKI

2 patents

Showing the top 50 of 54 patents by PatentIndex Score.