Inventor
OHKUBO HIROAKI
JP54 patents
⚠️ This page may combine multiple inventors who share the name “OHKUBO HIROAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC ELECTRONICS CORP
25 patentsUS6635912B2Oct 21, 2003
CMOS image sensor and manufacturing method thereof
NEC ELECTRONICS CORP115 citations98
US6841843B2Jan 11, 2005
Semiconductor integrated circuit device
NEC ELECTRONICS CORP29 citations93
US6639293B2Oct 28, 2003
Solid-state imaging device
NEC ELECTRONICS CORP32 citations93
US6879234B2Apr 12, 2005
Semiconductor integrated circuit
NEC ELECTRONICS CORP29 citations92
US7256456B2Aug 14, 2007
SOI substrate and semiconductor integrated circuit device
NEC ELECTRONICS CORP13 citations84
US7091576B2Aug 15, 2006
Inductor for semiconductor integrated circuit and method of fabricating the same
NEC ELECTRONICS CORP14 citations84
US6806522B2Oct 19, 2004
CMOS image sensor and manufacturing method for the same
NEC ELECTRONICS CORP16 citations84
US7030919B2Apr 18, 2006
Solid state image pick-up device
NEC ELECTRONICS CORP6 citations74
US6849913B2Feb 1, 2005
Integrated circuit including an inductor, active layers with isolation dielectrics, and multiple insulation layers
NEC ELECTRONICS CORP10 citations74
US6707116B2Mar 16, 2004
Integrated circuit and manufacturing method therefor
NEC ELECTRONICS CORP7 citations74
US6576882B2Jun 10, 2003
Image sensor
NEC ELECTRONICS CORP9 citations74
US7800668B2Sep 21, 2010
Solid state imaging device including a light receiving portion with a silicided surface
NEC ELECTRONICS CORP3 citations63
US7579673B2Aug 25, 2009
Semiconductor device having electrical fuse
NEC ELECTRONICS CORP2 citations63
US7544940B2Jun 9, 2009
Semiconductor device including vanadium oxide sensor element with restricted current density
NEC ELECTRONICS CORP2 citations63
US7432170B2Oct 7, 2008
Semiconductor device and fabrication method thereof
NEC ELECTRONICS CORP5 citations63
US7417277B2Aug 26, 2008
Semiconductor integrated circuit and method of manufacturing the same
NEC ELECTRONICS CORP6 citations63
US7345347B2Mar 18, 2008
Semiconductor device
NEC ELECTRONICS CORP6 citations63
US7288826B2Oct 30, 2007
Semiconductor integrated circuit device
NEC ELECTRONICS CORP3 citations63
US7211870B2May 1, 2007
Semiconductor device
NEC ELECTRONICS CORP2 citations63
US7095072B2Aug 22, 2006
Semiconductor device with wiring layers forming a capacitor
NEC ELECTRONICS CORP6 citations63
US7741692B2Jun 22, 2010
Integrated circuit device with temperature monitor members
NEC ELECTRONICS CORP2 citations62
US7391092B2Jun 24, 2008
Integrated circuit including a temperature monitor element and thermal conducting layer
NEC ELECTRONICS CORP5 citations62
US7777298B2Aug 17, 2010
Semiconductor device and method of manufacturing the same
NEC ELECTRONICS CORP0 citations52
US7498626B2Mar 3, 2009
Semiconductor device and method of manufacturing the same
NEC ELECTRONICS CORP0 citations52
US7432545B2Oct 7, 2008
Semiconductor device
NEC ELECTRONICS CORP1 citations52
NEC CORP
13 patentsUS6545360B1Apr 8, 2003
Semiconductor device and manufacturing method thereof
NEC CORP58 citations95
US6160298ADec 12, 2000
Full CMOS SRAM cell comprising Vcc and Vss buses on both sides of each of complementary data lines on a single level
NEC CORP44 citations92
US6133586AOct 17, 2000
Semiconductor memory device and method of fabricating the same
NEC CORP20 citations92
US5521860AMay 28, 1996
CMOS static memory
NEC CORP49 citations92
US6009010ADec 28, 1999
Static semiconductor memory device having data lines in parallel with power supply lines
NEC CORP8 citations74
US5811858ASep 22, 1998
Semiconductor integrated circuit device having gate or active area patterned to allow for misalignment
NEC CORP10 citations74
US5504705AApr 2, 1996
Semiconductor memory device
NEC CORP9 citations74
US6534803B2Mar 18, 2003
Electronic device, semiconductor device, and electrode forming method
NEC CORP6 citations63
US6153908ANov 28, 2000
Buried-gate semiconductor device with improved level of integration
NEC CORP2 citations63
US6127708AOct 3, 2000
Semiconductor device having an intervening region between channel stopper and diffusion region
NEC CORP2 citations63
US5926698AJul 20, 1999
Semiconductor memory device and method of fabricating the same
NEC CORP4 citations63
US7462921B2Dec 9, 2008
Integrated circuit device, method of manufacturing the same and method of forming vanadium oxide film
NEC CORP2 citations62
US7239002B2Jul 3, 2007
Integrated circuit device
NEC CORP6 citations62
OHKUBO HIROAKI
6 patentsUS8810699B2Aug 19, 2014
Solid state imaging device including a light receiving portion with a silicided surface
OHKUBO HIROAKI0 citations51
US8416330B2Apr 9, 2013
Solid state imaging device for imaging an object placed thereon
OHKUBO HIROAKI0 citations51
US8339182B2Dec 25, 2012
Semiconductor device
OHKUBO HIROAKI0 citations51
US8233063B2Jul 31, 2012
Solid state image pick-up device for imaging an object placed thereon
OHKUBO HIROAKI0 citations51
US8217709B2Jul 10, 2012
Semiconductor device
OHKUBO HIROAKI0 citations51
US8130297B2Mar 6, 2012
Solid state imaging device including a light receiving portion with a silicided surface
OHKUBO HIROAKI0 citations51
RENESAS ELECTRONICS CORP
4 patentsUS7973383B2Jul 5, 2011
Semiconductor integrated circuit device having a decoupling capacitor
RENESAS ELECTRONICS CORP7 citations84
US9305253B2Apr 5, 2016
Interface IC and memory card including the same
RENESAS ELECTRONICS CORP2 citations60
US8461907B2Jun 11, 2013
Semiconductor device
RENESAS ELECTRONICS CORP0 citations52
US8357990B2Jan 22, 2013
Semiconductor device
RENESAS ELECTRONICS CORP0 citations52
FURUMIYA MASAYUKI
2 patentsShowing the top 50 of 54 patents by PatentIndex Score.