P

Inventor

HICKMAN CRAIG A

US16 patents
⚠️ This page may combine multiple inventors who share the name “HICKMAN CRAIG A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

14 patents
US7038762B2May 2, 2006

Method and apparatus for irradiating a microlithographic substrate

MICRON TECHNOLOGY INC21 citations92
US6784975B2Aug 31, 2004

Method and apparatus for irradiating a microlithographic substrate

MICRON TECHNOLOGY INC28 citations92
US6519036B1Feb 11, 2003

System for processing semiconductor products

MICRON TECHNOLOGY INC17 citations92
US7370659B2May 13, 2008

Photolithographic stepper and/or scanner machines including cleaning devices and methods of cleaning photolithographic stepper and/or scanner machines

MICRON TECHNOLOGY INC8 citations73
US6529274B1Mar 4, 2003

System for processing semiconductor products

MICRON TECHNOLOGY INC12 citations73
US6909984B2Jun 21, 2005

Wafer alignment system

MICRON TECHNOLOGY INC6 citations69
US8029947B2Oct 4, 2011

Systems and methods for implementing and manufacturing reticles for use in photolithography tools

MICRON TECHNOLOGY INC4 citations62
US7361234B2Apr 22, 2008

Photolithographic stepper and/or scanner machines including cleaning devices and methods of cleaning photolithographic stepper and/or scanner machines

MICRON TECHNOLOGY INC4 citations62
US7298453B2Nov 20, 2007

Method and apparatus for irradiating a microlithographic substrate

MICRON TECHNOLOGY INC4 citations62
US6844933B2Jan 18, 2005

System for processing semiconductor products

MICRON TECHNOLOGY INC1 citations62
US6812999B2Nov 2, 2004

Device and method of correcting exposure defects in photolithography

MICRON TECHNOLOGY INC1 citations62
US6727975B1Apr 27, 2004

Device and method of correcting exposure defects in photolithography

MICRON TECHNOLOGY INC2 citations62
US6708131B1Mar 16, 2004

Wafer alignment system

MICRON TECHNOLOGY INC4 citations58
US6967707B2Nov 22, 2005

Device and method of correcting exposure defects in photolithography

MICRON TECHNOLOGY INC0 citations51

ZHOU JIANMING

1 patent

HICKMAN CRAIG A

1 patent