Inventor

LEE MI-JOUNG

KR2 patents

Patents

2 patents

US7733099B2Jun 8, 2010

Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect

SAMSUNG ELECTRONICS CO LTD6 citations58

US7705621B2Apr 27, 2010

Test pattern and method of monitoring defects using the same

SAMSUNG ELECTRONICS CO LTD3 citations56