Inventor

SHIMSHI RINAT

US10 patents

⚠️ This page may combine multiple inventors who share the name “SHIMSHI RINAT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

4 patents

US7937179B2May 3, 2011

Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects

APPLIED MATERIALS INC24 citations91

US7760929B2Jul 20, 2010

Grouping systematic defects with feedback from electrical inspection

APPLIED MATERIALS INC42 citations89

US7760347B2Jul 20, 2010

Design-based method for grouping systematic defects in lithography pattern writing system

APPLIED MATERIALS INC22 citations89

US7962864B2Jun 14, 2011

Stage yield prediction

APPLIED MATERIALS INC15 citations82

SAKHARE VIJAY

2 patents

US8224607B2Jul 17, 2012

Method and apparatus for robot calibrations with a calibrating device

SAKHARE VIJAY32 citations88

US8688398B2Apr 1, 2014

Method and apparatus for robot calibrations with a calibrating device

SAKHARE VIJAY10 citations79

KRISHNASAMY SEKAR

1 patent

US8260461B2Sep 4, 2012

Method and system for robot calibrations with a camera

KRISHNASAMY SEKAR21 citations86

SHIMSHI RINAT

1 patent

US8335582B2Dec 18, 2012

Software application to analyze event log and chart tool fail rate as function of chamber and recipe

SHIMSHI RINAT8 citations78

NEHMADI YOUVAL

1 patent

US8799831B2Aug 5, 2014

Inline defect analysis for sampling and SPC

NEHMADI YOUVAL6 citations70

SVIDENKO VICKY

1 patent

US8924904B2Dec 30, 2014

Method and apparatus for determining factors for design consideration in yield analysis

SVIDENKO VICKY2 citations52