Inventor

YAMADA KEIZO

JP54 patents

⚠️ This page may combine multiple inventors who share the name “YAMADA KEIZO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

YAMADA KEIZO

FAB SOLUTIONS INC

Semiconductor device tester which measures information related to a structure of a sample in a depth direction

Semiconductor device tester and semiconductor device test method

Contact hole standard test device

Semiconductor device test method and semiconductor device tester

Production managing system of semiconductor device

Semiconductor device tester

Semiconductor device tester

Film thickness measuring apparatus and a method for measuring a thickness of a film

Semiconductor device inspecting apparatus

Method and apparatus for measuring thickness of thin film

Semiconductor manufacturing apparatus

Contact hole standard test device, method of forming the same, method testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer

Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer

Semiconductor device test method and semiconductor device tester

Semiconductor device test method and semiconductor device tester

Production managing system of semiconductor device

Production managing system of semiconductor device

Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device

Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device

Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer

Semiconductor device test method and semiconductor device tester

Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer

Film thickness measuring apparatus and a method for measuring a thickness of a film

Semiconductor manufacturing device

NEC CORP

Light beam scanner using large electrostatic force

Presentation supporting device

Apparatus for three-dimensionally displaying object and method of doing the same

Electron beam radiator with cold cathode integral with focusing grid member and process of fabrication thereof

Semiconductor sensor

Semiconductor acceleration sensor and method of fabrication thereof

Acceleration sensing device having negative feedback loop

Field emission cold cathode element having exposed substrate

Electron beam radiator with cold cathode integral with focusing grid member and process of fabrication thereof

Image display device applying light beam scanning capable of direct image formation on retinas of observers

Method of manufacturing a semiconductor device

Locator device using capacitance

Cold cathode

Field emission cold cathode element with locally thickened gate electrode layer

Semiconductor sensor with nested weight portions for converting physical quantity into twisting strains

Simple data input device for supplying computer unit digital signal converted from analog signal

Vacuum device for controlling spatial position and path of electron

Semiconductor vacuum device with planar structure

TOPCON CORP

Semiconductor device tester

Semiconductor device test method and semiconductor device tester

Surface contamination analyzer for semiconductor wafers

Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device

SHIN KOBE ELECTRIC MACHINERY

Battery state determining apparatus

Power supply system and state of charge estimating method

HITACHI CHEMICAL CO LTD

Battery system

KANOH MITSUYOSHI

Direct-current power source apparatus