Inventor
HSU MEI-SHU
TW4 patents
Patents
4 patentsUS6906543B2Jun 14, 2005
Probe card for electrical testing a chip in a wide temperature range
STAR TECHN INC87 citations95
US7436171B2Oct 14, 2008
Apparatus for probing multiple integrated circuit devices
STAR TECHN INC12 citations82
US7253646B2Aug 7, 2007
Probe card with tunable stage and at least one replaceable probe
STAR TECHN INC15 citations82
US7295023B2Nov 13, 2007
Probe card
STAR TECHN INC5 citations71