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Inventor
RAMANUJAM RAM S
US
2 patents
Patents
2 patents
US7318214B1
Jan 8, 2008
System and method for reducing patterning variability in integrated circuit manufacturing through mask layout corrections
INVARIUM INC
149 citations
94
US7444615B2
Oct 28, 2008
Calibration on wafer sweet spots
INVARIUM INC
25 citations
90