Inventor
DAMON TIM
US6 patents
Patents
6 patentsUS6256593B1Jul 3, 2001
System for evaluating and reporting semiconductor test processes
MICRON TECHNOLOGY INC19 citations87
US6424161B2Jul 23, 2002
Apparatus and method for testing fuses
MICRON TECHNOLOGY INC13 citations80
US6762608B2Jul 13, 2004
Apparatus and method for testing fuses
MICRON TECHNOLOGY INC10 citations72
US6410352B2Jun 25, 2002
Apparatus and method for testing fuses
MICRON TECHNOLOGY INC9 citations72
US6070131AMay 30, 2000
System for evaluating and reporting semiconductor test processes
MICRON TECHNOLOGY INC3 citations57
US7464308B2Dec 9, 2008
CAM expected address search testmode
MICRON TECHNOLOGY INC0 citations49