Inventor
KIM GYUYEOL
KR7 patents
Patents
7 patentsUS12566213B2Mar 3, 2026
Test device and test method implementing the same
SAMSUNG ELECTRONICS CO LTD0 citations59
US12038458B2Jul 16, 2024
Probe for testing a semiconductor device and a probe card including the same
SAMSUNG ELECTRONICS CO LTD0 citations57
US10304708B2May 28, 2019
Test system for measuring propagation delay time of transmission line
SAMSUNG ELECTRONICS CO LTD1 citations57
US11378586B2Jul 5, 2022
Stiffener having an elastic portion
SAMSUNG ELECTRONICS CO LTD0 citations56
US11327095B2May 10, 2022
Probe cards, system for manufacturing semiconductor device, and method of manufacturing semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations49
US11921158B2Mar 5, 2024
Fan-out buffer with skew control function, operating method thereof, and probe card including the same
SAMSUNG ELECTRONICS CO LTD0 citations44
US11243232B2Feb 8, 2022
Test apparatuses including probe card for testing semiconductor devices and operation methods thereof
SAMSUNG ELECTRONICS CO LTD0 citations38