Inventor
JEN CHIH-YU
US6 patents
⚠️ This page may combine multiple inventors who share the name “JEN CHIH-YU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ASML NETHERLANDS BV
5 patentsUS12469674B2Nov 11, 2025
Photo-electrical evolution defect inspection
ASML NETHERLANDS BV0 citations61
US11651935B2May 16, 2023
Time-dependent defect inspection apparatus
ASML NETHERLANDS BV0 citations61
US11056311B2Jul 6, 2021
Time-dependent defect inspection apparatus
ASML NETHERLANDS BV0 citations61
US11175248B2Nov 16, 2021
Apparatus and method for detecting time-dependent defects in a fast-charging device
ASML NETHERLANDS BV0 citations58
US12567558B2Mar 3, 2026
Systems and methods for pulsed voltage contrast detection and capture of charging dynamics
ASML NETHERLANDS BV0 citations48