Inventor

CONNER GEORGE W

US29 patents

⚠️ This page may combine multiple inventors who share the name “CONNER GEORGE W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CONNER GEORGE W

TERADYNE INC

Low cost, highly parallel memory tester

Tester for LSI devices and memory devices

Low cost CMOS tester with edge rate compensation

Interface apparatus for semiconductor device tester

Hybrid AC/DC-coupled channel for automatic test equipment

Timing generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signal

Test system with differential signal measurement

Method and apparatus for adjustment of synchronous clock signals

Timing generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signal

Calibration device

Hybrid AC/DC-coupled channel for testing

Multi-stream interface for parallel test processing

High speed data transfer using calibrated, single-clock source synchronous serializer-deserializer protocol

CONNER GEORGE W

Protocol aware digital channel apparatus

Using pattern generators to control flow of data to and from a semiconductor device under test

General purpose protocol engine

Reuseable straw caddy

Reuseable straw wash tool assembly

Reusable straw wash tool assembly

Straw dispenser

Method for testing in a reconfigurable tester

Tracker circuit and method for automated test equipment systems

General purpose protocol engine

SIGNETICS CORP

Method of fabricating a programmable read-only memory cell incorporating an antifuse utilizing deposition of amorphous semiconductor layer

Programmable read-only memory formed with opposing PN diodes

Method for manufacturing programmable read-only memory containing cells formed with opposing diodes

PHILIPS ELECTRONICS NA

Method of forming a self-aligned bipolar transistor

NORTH AMERICAN PHILIPS CORP SI

Programmable read-only memory

NGUYEN THIEN D

Method and apparatus for low latency communication in an automatic testing system