P

Inventor

KWAK JONGTAE

US64 patents
⚠️ This page may combine multiple inventors who share the name “KWAK JONGTAE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

43 patents
US7671648B2Mar 2, 2010

System and method for an accuracy-enhanced DLL during a measure initialization mode

MICRON TECHNOLOGY INC57 citations98
US7656745B2Feb 2, 2010

Circuit, system and method for controlling read latency

MICRON TECHNOLOGY INC54 citations98
US7227809B2Jun 5, 2007

Clock generator having a delay locked loop and duty cycle correction circuit in a parallel configuration

MICRON TECHNOLOGY INC83 citations98
US8018791B2Sep 13, 2011

Circuit, system and method for controlling read latency

MICRON TECHNOLOGY INC38 citations96
US7716510B2May 11, 2010

Timing synchronization circuit with loop counter

MICRON TECHNOLOGY INC40 citations96
US7443216B2Oct 28, 2008

Trimmable delay locked loop circuitry with improved initialization characteristics

MICRON TECHNOLOGY INC48 citations96
US9536591B1Jan 3, 2017

Staggered DLL clocking on N-Detect QED to minimize clock command and delay path

MICRON TECHNOLOGY INC27 citations94
US7541851B2Jun 2, 2009

Control of a variable delay line using line entry point to modify line power supply voltage

MICRON TECHNOLOGY INC17 citations93
US7629819B2Dec 8, 2009

Seamless coarse and fine delay structure for high performance DLL

MICRON TECHNOLOGY INC23 citations92
US10951232B2Mar 16, 2021

Error correction bit flipping scheme

MICRON TECHNOLOGY INC6 citations84
US9529379B2Dec 27, 2016

Timing synchronization circuit with loop counter

MICRON TECHNOLOGY INC10 citations84
US9508417B2Nov 29, 2016

Methods and apparatuses for controlling timing paths and latency based on a loop delay

MICRON TECHNOLOGY INC9 citations84
US8878586B2Nov 4, 2014

Seamless coarse and fine delay structure for high performance DLL

MICRON TECHNOLOGY INC7 citations84
US8350607B2Jan 8, 2013

System and method for an accuracy-enhanced DLL during a measure initialization mode

MICRON TECHNOLOGY INC9 citations84
US7728639B2Jun 1, 2010

Trimmable delay locked loop circuitry with improved initialization characteristics

MICRON TECHNOLOGY INC14 citations84
US7719334B2May 18, 2010

Apparatus and method for multi-phase clock generation

MICRON TECHNOLOGY INC8 citations84
US7642827B2Jan 5, 2010

Apparatus and method for multi-phase clock generation

MICRON TECHNOLOGY INC11 citations84
US7554375B2Jun 30, 2009

Delay line circuit

MICRON TECHNOLOGY INC9 citations84
US7417478B2Aug 26, 2008

Delay line circuit

MICRON TECHNOLOGY INC18 citations84
US10090026B2Oct 2, 2018

Apparatuses and methods for providing internal memory commands and control signals in semiconductor memories

MICRON TECHNOLOGY INC6 citations83
US9508409B2Nov 29, 2016

Apparatuses and methods for implementing masked write commands

MICRON TECHNOLOGY INC12 citations83
US7276951B2Oct 2, 2007

Delay line circuit

MICRON TECHNOLOGY INC7 citations74
US11799496B2Oct 24, 2023

Error correction bit flipping scheme

MICRON TECHNOLOGY INC1 citations73
US11675662B2Jun 13, 2023

Extended error detection for a memory device

MICRON TECHNOLOGY INC3 citations73
US11061771B2Jul 13, 2021

Extended error detection for a memory device

MICRON TECHNOLOGY INC4 citations73
US10795759B2Oct 6, 2020

Apparatuses and methods for error correction coding and data bus inversion for semiconductor memories

MICRON TECHNOLOGY INC2 citations73
US10691533B2Jun 23, 2020

Error correction code scrub scheme

MICRON TECHNOLOGY INC2 citations73
US10658019B2May 19, 2020

Circuit, system and method for controlling read latency

MICRON TECHNOLOGY INC2 citations73
US9571105B2Feb 14, 2017

System and method for an accuracy-enhanced DLL during a measure initialization mode

MICRON TECHNOLOGY INC2 citations73
US10860469B2Dec 8, 2020

Apparatuses and methods for providing internal memory commands and control signals in semiconductor memories

MICRON TECHNOLOGY INC1 citations72
US10534394B2Jan 14, 2020

Apparatuses and methods for providing internal memory commands and control signals in semiconductor memories

MICRON TECHNOLOGY INC3 citations72
US11360848B2Jun 14, 2022

Error correction code scrub scheme

MICRON TECHNOLOGY INC0 citations63
US11336298B2May 17, 2022

Error correction bit flipping scheme

MICRON TECHNOLOGY INC0 citations63
US8928376B2Jan 6, 2015

System and method for an accuracy-enhanced DLL during a measure initialization mode

MICRON TECHNOLOGY INC3 citations63
US8879337B1Nov 4, 2014

Dynamic burst length output control in a memory

MICRON TECHNOLOGY INC2 citations63
US7973577B2Jul 5, 2011

Control of a variable delay line using line entry point to modify line power supply voltage

MICRON TECHNOLOGY INC2 citations63
US7622908B2Nov 24, 2009

Built-in system and method for testing integrated circuit timing parameters

MICRON TECHNOLOGY INC2 citations63
US7423456B2Sep 9, 2008

Fast response time, low power phase detector circuits, devices and systems incorporating the same, and associated methods

MICRON TECHNOLOGY INC6 citations63
US7362634B2Apr 22, 2008

Built-in system and method for testing integrated circuit timing parameters

MICRON TECHNOLOGY INC5 citations63
US12424297B2Sep 23, 2025

Error control for memory device

MICRON TECHNOLOGY INC0 citations62
US11322218B2May 3, 2022

Error control for memory device

MICRON TECHNOLOGY INC0 citations62
US11314591B2Apr 26, 2022

Apparatuses and methods for error correction coding and data bus inversion for semiconductor memories

MICRON TECHNOLOGY INC0 citations62
US12499921B2Dec 16, 2025

Divided clock control

MICRON TECHNOLOGY INC0 citations52

KWAK JONGTAE

6 patents

MAZUMDER KALLOL

1 patent

Showing the top 50 of 64 patents by PatentIndex Score.