Inventor

FUJISAKI KENICHI

JP24 patents

⚠️ This page may combine multiple inventors who share the name “FUJISAKI KENICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FUJISAKI KENICHI

ADVANTEST CORP

Memory testing apparatus

High speed pattern generating method and high speed pattern generator using the method

Address pattern generator for burst address access of an SDRAM

Address test pattern generator for burst transfer operation of a SDRAM

Memory testing device for multiported DRAMs

Memory testing device

Memory testing device

Analyzing device for saving semiconductor memory failures

Memory tester having defect analysis memory with two storage sections

Semiconductor memory testing apparatus

Test pattern generator for memories having a block write function

Test pattern generator

Multiple bit test pattern generator

Testing apparatus and testing method

Test apparatus having a pattern memory and test method for testing a device under test

DAINIPPON INK & CHEMICALS

Heat storage molded body, heat storage laminate, and heat storage molded body production method

Heat storage sheet

Heat storage molded body, heat storage laminate, and heat storage molded body production method

Heat-storage composition

FUJISAKI KENICHI

Test apparatus and repair analysis method

Clear instruction information to indicate whether memory test failure information is valid

Test apparatus

ADVANTEST COPORATION

Memory testing apparatus

MOTOROLA INC

Scan test circuit for use in semiconductor integrated circuit