Inventor
BARABI NASSER
US35 patents
⚠️ This page may combine multiple inventors who share the name “BARABI NASSER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ESSAI INC
18 patentsUS10908207B2Feb 2, 2021
Systems and methods for conforming device testers to integrated circuit device with pressure relief valve
ESSAI INC31 citations93
US10126356B2Nov 13, 2018
Systems and methods for conforming test tooling to integrated circuit device with whirlwind cold plate
ESSAI INC30 citations93
US7663388B2Feb 16, 2010
Active thermal control unit for maintaining the set point temperature of a DUT
ESSAI INC26 citations90
US7651340B2Jan 26, 2010
Chip actuator cover assembly
ESSAI INC10 citations83
US11378588B2Jul 5, 2022
Contactor with angled depressible probes in shifted bores
ESSAI INC3 citations72
US10481175B2Nov 19, 2019
Contactor with angled depressible probes
ESSAI INC3 citations72
US9804223B2Oct 31, 2017
Systems and methods for conforming test tooling to integrated circuit device with heater socket
ESSAI INC4 citations72
US9007080B2Apr 14, 2015
Systems and methods for conforming device testers to integrated circuit device profiles with feedback temperature control
ESSAI INC4 citations72
US11293976B1Apr 5, 2022
Integrated circuit device test tooling with dual angle cavities
ESSAI INC1 citations62
US7583097B2Sep 1, 2009
Contactor nest for an IC device and method
ESSAI INC4 citations62
US9494642B2Nov 15, 2016
Systems and methods for conforming test tooling to integrated circuit device profiles with ejection mechanisms
ESSAI INC2 citations61
US9383406B2Jul 5, 2016
Systems and methods for conforming device testers to integrated circuit device with pressure relief valve
ESSAI INC2 citations61
US9557373B2Jan 31, 2017
Systems and methods for conforming test tooling to integrated circuit device profiles with convex support structure
ESSAI INC0 citations51
US11906550B2Feb 20, 2024
Probe system for QFP integrated circuit device test tooling
ESSAI INC0 citations47
US12085587B2Sep 10, 2024
Hybrid shielding sockets with impedance tuning for integrated circuit device test tooling
ESSAI INC0 citations46
US10094853B2Oct 9, 2018
Systems and methods for reliable integrated circuit device test tooling
ESSAI INC0 citations46
US9279852B2Mar 8, 2016
Systems and methods for conforming test tooling to integrated circuit device profiles with sockets having secured and replaceable bushings
ESSAI INC0 citations40
US9229049B2Jan 5, 2016
Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestals
ESSAI INC0 citations40
CERPROBE CORP
5 patentsUS6559665B1May 6, 2003
Test socket for an IC device
CERPROBE CORP82 citations98
US6208155B1Mar 27, 2001
Probe tip and method for making electrical contact with a solder ball contact of an integrated circuit device
CERPROBE CORP118 citations97
US6297654B1Oct 2, 2001
Test socket and method for testing an IC device in a dead bug orientation
CERPROBE CORP73 citations96
US6220870B1Apr 24, 2001
IC chip socket and method
CERPROBE CORP73 citations95
US6354859B1Mar 12, 2002
Cover assembly for an IC socket
CERPROBE CORP41 citations92
BARABI NASSER
5 patentsUS8508245B1Aug 13, 2013
Thermal control unit used to maintain the temperature of IC devices under test
BARABI NASSER21 citations89
US9766268B2Sep 19, 2017
Contactor with angled spring probes
BARABI NASSER8 citations78
US8493085B2Jul 23, 2013
Spring contact pin for an ic test socket and the like
BARABI NASSER6 citations72
US8653842B2Feb 18, 2014
Systems and methods for thermal control of integrated circuits during testing
BARABI NASSER2 citations61
US8981802B2Mar 17, 2015
Systems and methods for conforming device testers to integrated circuit device profiles
BARABI NASSER3 citations57