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Inventor
OJIMA YUKI
JP
4 patents
⚠️ This page may combine multiple inventors who share the name “OJIMA YUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
2 patents
US6929892B2
Aug 16, 2005
Method of monitoring an exposure process
HITACHI HIGH TECH CORP
25 citations
92
US7723681B2
May 25, 2010
Observation method with electron beam
HITACHI HIGH TECH CORP
0 citations
49
YAMAZAKI MINORU
2 patents
US8080790B2
Dec 20, 2011
Scanning electron microscope
YAMAZAKI MINORU
7 citations
82
US8487253B2
Jul 16, 2013
Scanning electron microscope
YAMAZAKI MINORU
0 citations
50