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Inventor
ARCHWAMETY ALBERT
SG
3 patents
⚠️ This page may combine multiple inventors who share the name “ARCHWAMETY ALBERT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AMANULLAH AJHARALI
1 patent
US8885918B2
Nov 11, 2014
System and method for inspecting a wafer
AMANULLAH AJHARALI
9 citations
75
Generic Power Ptd Ltd
1 patent
US10151580B2
Dec 11, 2018
Methods of inspecting a 3D object using 2D image processing
Generic Power Ptd Ltd
1 citations
38
MIT SEMICONDUCTOR PTE LTD
1 patent
US11825211B2
Nov 21, 2023
Method of color inspection by using monochrome imaging with multiple wavelengths of light
MIT SEMICONDUCTOR PTE LTD
0 citations
37