Inventor
STATHIS JAMES H
US13 patents
⚠️ This page may combine multiple inventors who share the name “STATHIS JAMES H”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
10 patentsUS10746782B2Aug 18, 2020
Accelerated wafer testing using non-destructive and localized stress
IBM4 citations73
US10739397B2Aug 11, 2020
Accelerated wafer testing using non-destructive and localized stress
IBM2 citations73
US9287185B1Mar 15, 2016
Determining appropriateness of sampling integrated circuit test data in the presence of manufacturing variations
IBM3 citations73
US8839180B1Sep 16, 2014
Dielectric reliability assessment for advanced semiconductors
IBM4 citations72
US10102090B2Oct 16, 2018
Non-destructive analysis to determine use history of processor
IBM2 citations71
US9026981B2May 5, 2015
Dielectric reliability assessment for advanced semiconductors
IBM3 citations62
US6326732B1Dec 4, 2001
Apparatus and method for non-contact stress evaluation of wafer gate dielectric reliability
IBM3 citations62
US10574240B2Feb 25, 2020
Ring oscillator structures to determine local voltage value
IBM0 citations52
US10552278B2Feb 4, 2020
Non-destructive analysis to determine use history of processor
IBM0 citations51
US6602772B2Aug 5, 2003
Method for non-contact stress evaluation of wafer gate dielectric reliability
IBM0 citations51