Inventor
PATIDAR ANKITA
TW18 patents
Patents
18 patentsUS11727177B2Aug 15, 2023
Integrated circuit design method, system and computer program product
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11699010B2Jul 11, 2023
Method and system for reducing migration errors
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11379643B2Jul 5, 2022
Integrated circuit design method, system and computer program product
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11055455B1Jul 6, 2021
Method and system for reducing migration errors
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11068633B2Jul 20, 2021
Fault diagnostics
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US12314644B2May 27, 2025
Integrated circuit design method, system and computer program product
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12229483B2Feb 18, 2025
Method and system for reducing migration errors
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11837308B2Dec 5, 2023
Systems and methods to detect cell-internal defects
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11663387B2May 30, 2023
Fault diagnostics
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11386253B2Jul 12, 2022
Power-aware scan partitioning
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11295831B2Apr 5, 2022
Systems and methods to detect cell-internal defects
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US10871518B2Dec 22, 2020
Systems and methods for determining systematic defects
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US10685157B2Jun 16, 2020
Power-aware scan partitioning
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11113444B2Sep 7, 2021
Machine-learning based scan design enablement platform
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations57
US12399211B2Aug 26, 2025
Method of testing an integrated circuit and testing system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US11879933B2Jan 23, 2024
Method of testing an integrated circuit and testing system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12536357B2Jan 27, 2026
Systems and methods for modeling via defect
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US12346147B2Jul 1, 2025
Circuit and methodology for power profile
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations45