Inventor
SARMA ROBIN C
US3 patents
Patents
3 patentsUS6870375B2Mar 22, 2005
System and method for measuring a capacitance associated with an integrated circuit
TEXAS INSTRUMENTS INC30 citations87
US6788074B2Sep 7, 2004
System and method for using a capacitance measurement to monitor the manufacture of a semiconductor
TEXAS INSTRUMENTS INC20 citations87
US6856143B2Feb 15, 2005
System and method for measuring a capacitance of a conductor
TEXAS INSTRUMENTS INC4 citations57