Inventor
MADGE ROBERT
US15 patents
⚠️ This page may combine multiple inventors who share the name “MADGE ROBERT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LSI LOGIC CORP
12 patentsUS6807655B1Oct 19, 2004
Adaptive off tester screening method based on intrinsic die parametric measurements
LSI LOGIC CORP107 citations96
US6601008B1Jul 29, 2003
Parametric device signature
LSI LOGIC CORP21 citations92
US6943042B2Sep 13, 2005
Method of detecting spatially correlated variations in a parameter of an integrated circuit die
LSI LOGIC CORP19 citations91
US6787379B1Sep 7, 2004
Method of detecting spatially correlated variations in a parameter of an integrated circuit die
LSI LOGIC CORP17 citations91
US6682947B1Jan 27, 2004
Feed forward testing
LSI LOGIC CORP7 citations73
US6647348B2Nov 11, 2003
Latent defect classification system
LSI LOGIC CORP7 citations73
US6476631B1Nov 5, 2002
Defect screening using delta VDD
LSI LOGIC CORP8 citations73
US7073107B2Jul 4, 2006
Adaptive defect based testing
LSI LOGIC CORP7 citations65
US6931297B1Aug 16, 2005
Feature targeted inspection
LSI LOGIC CORP6 citations62
US6624048B1Sep 23, 2003
Die attach back grinding
LSI LOGIC CORP3 citations62
US6532431B1Mar 11, 2003
Ratio testing
LSI LOGIC CORP3 citations62
US7079963B2Jul 18, 2006
Modified binary search for optimizing efficiency of data collection time
LSI LOGIC CORP3 citations54