Inventor

WEILAND LARG H

US13 patents

Patents

13 patents

US6901564B2May 31, 2005

System and method for product yield prediction

PDF SOLUTIONS INC143 citations98

US6834375B1Dec 21, 2004

System and method for product yield prediction using a logic characterization vehicle

PDF SOLUTIONS INC246 citations98

US6449749B1Sep 10, 2002

System and method for product yield prediction

PDF SOLUTIONS INC202 citations98

US7174521B2Feb 6, 2007

System and method for product yield prediction

PDF SOLUTIONS INC32 citations96

US7673262B2Mar 2, 2010

System and method for product yield prediction

PDF SOLUTIONS INC11 citations92

US7373625B2May 13, 2008

System and method for product yield prediction

PDF SOLUTIONS INC12 citations92

US7356800B2Apr 8, 2008

System and method for product yield prediction

PDF SOLUTIONS INC15 citations92

US6475871B1Nov 5, 2002

Passive multiplexor test structure for integrated circuit manufacturing

PDF SOLUTIONS INC32 citations92

US7434197B1Oct 7, 2008

Method for improving mask layout and fabrication

PDF SOLUTIONS INC21 citations90

US6787800B2Sep 7, 2004

Test vehicle with zig-zag structures

PDF SOLUTIONS INC18 citations84

US7197726B2Mar 27, 2007

Test structures for estimating dishing and erosion effects in copper damascene technology

PDF SOLUTIONS INC11 citations82

US7024642B2Apr 4, 2006

Extraction method of defect density and size distributions

PDF SOLUTIONS INC16 citations82

US7154115B2Dec 26, 2006

Zoom in pin nest structure, test vehicle having the structure, and method of fabricating the structure

PDF SOLUTIONS INC4 citations62