Inventor

SAKAI TSUNEHIRO

JP5 patents

⚠️ This page may combine multiple inventors who share the name “SAKAI TSUNEHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HAYAKAWA KOICHI

1 patent

US8595666B2Nov 26, 2013

Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying program

HAYAKAWA KOICHI10 citations81

SAKAI TSUNEHIRO

1 patent

US8995748B2Mar 31, 2015

Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying method

SAKAI TSUNEHIRO7 citations76

ISOMAE YUYA

1 patent

US8625906B2Jan 7, 2014

Image classification standard update method, program, and image classification device

ISOMAE YUYA4 citations64

KONISHI JUNKO

1 patent

US8472696B2Jun 25, 2013

Observation condition determination support device and observation condition determination support method

KONISHI JUNKO3 citations54

HITACHI HIGH TECH CORP

1 patent

US10141159B2Nov 27, 2018

Sample observation device having a selectable acceleration voltage

HITACHI HIGH TECH CORP0 citations38