Inventor

OMLOR LARS

US20 patents

⚠️ This page may combine multiple inventors who share the name “OMLOR LARS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OMLOR LARS

ZEISS CARL MEDITEC AG

Optical coherence tomography for performing measurements on the retina

Patient tuned ophthalmic imaging system with single exposure multi-type imaging, improved focusing, and improved angiography image sequence display

3D calibration body, calibration method for the spatial calibration of an optical imaging system, calibration element and calibration method for calibrating an optical imaging system

System for OCT image translation, ophthalmic image denoising, and neural network therefor

ZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH

Motion-measuring system of a machine and method for operating the motion-measuring system

Coordinate measuring machine and method for measuring coordinates of a workpiece

Method and device for additive manufacturing utilizing simulation test results of a workpiece

CARL ZEISS X RAY MICROSCOPY INC

Optical three-dimensional scanning for collision avoidance in microscopy system

Accessible neural network image processing workflow

Edge phase effects removal using wavelet correction and particle classification using combined absorption and phase contrast

ZEISS CARL MICROSCOPY GMBH

Apparatus and method for capturing images using lighting from different lighting angles

Method and devices for displaying stereoscopic images

Stereoscopy method and stereoscopy apparatus

ZEISS CARL VISION INT GMBH

Method and system for determining the spatial structure of an object

Method and apparatus for generating a 3D reconstruction of an object

ZEISS CARL AG

Device and method for measuring a surface topography, and calibration method

Device and method for measuring a surface topography, and calibration method

ZEISS CARL SMT GMBH

System, method and marker for the determination of the position of a movable object in space

Method to detect a defect on a lithographic sample and metrology system to perform such a method

ZEISS CARL MEDITEC INC

Method and system for choroid-scleral segmentation using deep learning with a choroid-scleral layer model