Inventor
HIROSE OSAMU
JP49 patents
⚠️ This page may combine multiple inventors who share the name “HIROSE OSAMU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOYODA GOSEI KK
11 patentsUS5791682AAug 11, 1998
Air bag device with air bag and inflation mounting structure
TOYODA GOSEI KK66 citations95
US9550525B2Jan 24, 2017
Steering wheel
TOYODA GOSEI KK21 citations94
US8794662B2Aug 5, 2014
Vibration control structure for steering wheel
TOYODA GOSEI KK30 citations92
US6568704B2May 27, 2003
Air bag cover with ornament
TOYODA GOSEI KK37 citations92
US8342567B2Jan 1, 2013
Airbag-equipped steering wheel device
TOYODA GOSEI KK23 citations91
US10596990B2Mar 24, 2020
Head-protecting airbag device
TOYODA GOSEI KK8 citations84
US9156400B2Oct 13, 2015
Steering wheel
TOYODA GOSEI KK17 citations84
US7481455B2Jan 27, 2009
Airbag system for steering wheel
TOYODA GOSEI KK19 citations84
USRE47687ENov 5, 2019
Damping system for steering wheel
TOYODA GOSEI KK8 citations83
US10351171B2Jul 16, 2019
Steering wheel
TOYODA GOSEI KK0 citations50
US11443904B2Sep 13, 2022
Steering wheel
TOYODA GOSEI KK0 citations43
ISHIDA SEISAKUSHO
10 patentsUS7570787B2Aug 4, 2009
X-ray inspection apparatus and method for creating an image processing procedure for the X-ray inspection apparatus
ISHIDA SEISAKUSHO12 citations84
US9752996B2Sep 5, 2017
X-ray inspection device
ISHIDA SEISAKUSHO3 citations72
US10151622B2Dec 11, 2018
Combination weighing device for weighing articles conveyed to a hopper
ISHIDA SEISAKUSHO3 citations70
US7991110B2Aug 2, 2011
Weight inspection apparatus and weight inspection system provided therewith
ISHIDA SEISAKUSHO5 citations63
US7260177B2Aug 21, 2007
X-ray inspection apparatus
ISHIDA SEISAKUSHO3 citations63
US8019040B2Sep 13, 2011
X-ray inspection device and production system
ISHIDA SEISAKUSHO6 citations62
US10788436B2Sep 29, 2020
X-ray examination device
ISHIDA SEISAKUSHO1 citations59
US12590909B2Mar 31, 2026
X-ray inspection apparatus and sensitivity correction method for x-ray inspection apparatus
ISHIDA SEISAKUSHO0 citations50
US12504387B2Dec 23, 2025
X-ray inspection apparatus and sensitivity correction method for x-ray inspection apparatus
ISHIDA SEISAKUSHO0 citations50
US12429438B2Sep 30, 2025
X-ray inspection device
ISHIDA SEISAKUSHO0 citations48
TOKYO ELECTRON LTD
9 patentsUS6104002AAug 15, 2000
Heat treating apparatus
TOKYO ELECTRON LTD388 citations99
US5941083AAug 24, 1999
Cooling device and cooling method
TOKYO ELECTRON LTD41 citations96
US5834737ANov 10, 1998
Heat treating apparatus
TOKYO ELECTRON LTD77 citations96
US5817156AOct 6, 1998
Substrate heat treatment table apparatus
TOKYO ELECTRON LTD69 citations96
US6216475B1Apr 17, 2001
Cooling device and cooling method
TOKYO ELECTRON LTD19 citations92
US5762745AJun 9, 1998
Substrate processing apparatus
TOKYO ELECTRON LTD54 citations92
US6456480B1Sep 24, 2002
Processing apparatus and a processing method
TOKYO ELECTRON LTD18 citations84
US6889764B2May 10, 2005
Cooling device and cooling method
TOKYO ELECTRON LTD10 citations74
US6002572ADec 14, 1999
Processing apparatus and a processing method
TOKYO ELECTRON LTD15 citations73
TDK CORP
6 patentsUS12400776B2Aug 26, 2025
Magnetic core and method for manufacturing same, and coil component
TDK CORP0 citations62
US11118076B2Sep 14, 2021
Black marker composition and electronic component using the same
TDK CORP0 citations62
US11935700B2Mar 19, 2024
Laminated electronic component with differing glass content electrodes
TDK CORP1 citations61
US7075405B2Jul 11, 2006
Multilayer chip varistor and method of manufacturing the same
TDK CORP6 citations59
US6738251B2May 18, 2004
Conductive pattern incorporated in a multilayered substrate, multilayered substrate incorporating a conductive pattern, and a method of fabricating a multilayered substrate
TDK CORP0 citations52
US9496088B2Nov 15, 2016
Electronic component and method of manufacturing electronic component
TDK CORP1 citations50