Inventor
YULI OFER
IL4 patents
⚠️ This page may combine multiple inventors who share the name “YULI OFER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
2 patentsUS11189451B2Nov 30, 2021
Charged particle beam source and a method for assembling a charged particle beam source
APPLIED MATERIALS ISRAEL LTD0 citations58
US10886092B2Jan 5, 2021
Charged particle beam source and a method for assembling a charged particle beam source
APPLIED MATERIALS ISRAEL LTD0 citations58
APPLIED MATERIALS INC
2 patentsUS11139142B2Oct 5, 2021
High-resolution three-dimensional profiling of features in advanced semiconductor devices in a non-destructive manner using electron beam scanning electron microscopy
APPLIED MATERIALS INC1 citations58
US10943763B1Mar 9, 2021
Use of electron beam scanning electron microscopy for characterization of a sidewall occluded from line-of-sight of the electron beam
APPLIED MATERIALS INC0 citations58