Inventor
YAMANE TOSHIKI
JP4 patents
Patents
4 patentsUS5351126ASep 27, 1994
Optical measurement system for determination of an object's profile or thickness
MATSUSHITA ELECTRIC WORKS LTD46 citations91
US6920180B1Jul 19, 2005
Image processing inspection apparatus
MATSUSHITA ELECTRIC WORKS LTD8 citations71
US5875004AFeb 23, 1999
Image processing inspection apparatus
MATSUSHITA ELECTRIC WORKS LTD7 citations66
US7145595B2Dec 5, 2006
Image processing and inspection system
MATSUSHITA ELECTRIC WORKS LTD4 citations58