Inventor
SATO SHINYA
JP139 patents
⚠️ This page may combine multiple inventors who share the name “SATO SHINYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
20 patentsUS7266738B2Sep 4, 2007
Test apparatus, phase adjusting method and memory controller
ADVANTEST CORP20 citations93
US6597753B1Jul 22, 2003
Delay clock generating apparatus and delay time measuring apparatus
ADVANTEST CORP22 citations93
US6154862ANov 28, 2000
Defect analysis memory for memory tester
ADVANTEST CORP22 citations93
US5854796ADec 29, 1998
Method of and apparatus for testing semiconductor memory
ADVANTEST CORP41 citations93
US5790559AAug 4, 1998
Semiconductor memory testing apparatus
ADVANTEST CORP41 citations93
US7359822B2Apr 15, 2008
Testing device
ADVANTEST CORP21 citations92
US7010729B2Mar 7, 2006
Timing generator and test apparatus
ADVANTEST CORP22 citations92
US6374378B1Apr 16, 2002
Failure analysis memory for semiconductor memory testing devices and its storage method
ADVANTEST CORP30 citations92
US5539699AJul 23, 1996
Flash memory testing apparatus
ADVANTEST CORP49 citations90
US7945826B2May 17, 2011
Test apparatus and test method
ADVANTEST CORP21 citations89
US7661043B2Feb 9, 2010
Test apparatus, and method of manufacturing semiconductor memory
ADVANTEST CORP11 citations84
US7461316B2Dec 2, 2008
Multi-strobe generation apparatus, test apparatus and adjustment method
ADVANTEST CORP10 citations84
US6990613B2Jan 24, 2006
Test apparatus
ADVANTEST CORP14 citations84
US6571353B1May 27, 2003
Fail information obtaining device and semiconductor memory tester using the same
ADVANTEST CORP13 citations84
US6115833ASep 5, 2000
Semiconductor memory testing apparatus
ADVANTEST CORP19 citations84
US7447955B2Nov 4, 2008
Test apparatus and test method
ADVANTEST CORP14 citations83
US7406646B2Jul 29, 2008
Multi-strobe apparatus, testing apparatus, and adjusting method
ADVANTEST CORP15 citations83
US7984345B2Jul 19, 2011
Test apparatus and test method
ADVANTEST CORP11 citations77
US7216271B2May 8, 2007
Testing apparatus and a testing method
ADVANTEST CORP9 citations74
US6651179B1Nov 18, 2003
Delay time judging apparatus
ADVANTEST CORP8 citations74
SONY CORP
6 patentsUS9929200B2Mar 27, 2018
Image pickup device, method of manufacturing image pickup device, and electronic apparatus
SONY CORP4 citations84
US5255144AOct 19, 1993
Brake device for tape reel in magnetic tape cassette
SONY CORP7 citations74
US11056524B2Jul 6, 2021
Image pickup device, method of manufacturing image pickup device, and electronic apparatus
SONY CORP1 citations73
US10381392B2Aug 13, 2019
Image pickup device, method of manufacturing image pickup device, and electronic apparatus
SONY CORP1 citations73
US4945440AJul 31, 1990
Tape cassette with transparent reel viewing windows and laminated three-color construction
SONY CORP9 citations73
US4901171AFeb 13, 1990
Optical tape end sensing arrangement for magnetic tape cassette
SONY CORP11 citations73
SATO SHINYA
3 patentsHINO MOTORS LTD
2 patentsHITACHI LTD
2 patentsTOSHIBA KK
2 patentsSEIKO EPSON CORP
2 patentsUS10306217B2May 28, 2019
Display device, control method for display device, and computer program
SEIKO EPSON CORP8 citations84
US10467770B2Nov 5, 2019
Computer program for calibration of a head-mounted display device and head-mounted display device using the computer program for calibration of a head-mounted display device
SEIKO EPSON CORP14 citations81
CKD CORP
2 patentsOLYMPUS CORP
2 patentsDAINIPPON PRINTING CO LTD
1 patentTASHIRO NAOYUKI
1 patentSONY SEMICONDUCTOR SOLUTIONS CORP
1 patentTOYOTA JIDOSHOKKI KK
1 patentHOSOYA MITSURU
1 patentHONDA MOTOR CO LTD
1 patentHITACHI ASTEMO LTD
1 patentHITACHI CONSTRUCTION MACH CO
1 patentPANASONIC CORP
1 patentShowing the top 50 of 139 patents by PatentIndex Score.