P

Inventor

SATO SHINYA

JP139 patents
⚠️ This page may combine multiple inventors who share the name “SATO SHINYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANTEST CORP

20 patents
US7266738B2Sep 4, 2007

Test apparatus, phase adjusting method and memory controller

ADVANTEST CORP20 citations93
US6597753B1Jul 22, 2003

Delay clock generating apparatus and delay time measuring apparatus

ADVANTEST CORP22 citations93
US6154862ANov 28, 2000

Defect analysis memory for memory tester

ADVANTEST CORP22 citations93
US5854796ADec 29, 1998

Method of and apparatus for testing semiconductor memory

ADVANTEST CORP41 citations93
US5790559AAug 4, 1998

Semiconductor memory testing apparatus

ADVANTEST CORP41 citations93
US7359822B2Apr 15, 2008

Testing device

ADVANTEST CORP21 citations92
US7010729B2Mar 7, 2006

Timing generator and test apparatus

ADVANTEST CORP22 citations92
US6374378B1Apr 16, 2002

Failure analysis memory for semiconductor memory testing devices and its storage method

ADVANTEST CORP30 citations92
US5539699AJul 23, 1996

Flash memory testing apparatus

ADVANTEST CORP49 citations90
US7945826B2May 17, 2011

Test apparatus and test method

ADVANTEST CORP21 citations89
US7661043B2Feb 9, 2010

Test apparatus, and method of manufacturing semiconductor memory

ADVANTEST CORP11 citations84
US7461316B2Dec 2, 2008

Multi-strobe generation apparatus, test apparatus and adjustment method

ADVANTEST CORP10 citations84
US6990613B2Jan 24, 2006

Test apparatus

ADVANTEST CORP14 citations84
US6571353B1May 27, 2003

Fail information obtaining device and semiconductor memory tester using the same

ADVANTEST CORP13 citations84
US6115833ASep 5, 2000

Semiconductor memory testing apparatus

ADVANTEST CORP19 citations84
US7447955B2Nov 4, 2008

Test apparatus and test method

ADVANTEST CORP14 citations83
US7406646B2Jul 29, 2008

Multi-strobe apparatus, testing apparatus, and adjusting method

ADVANTEST CORP15 citations83
US7984345B2Jul 19, 2011

Test apparatus and test method

ADVANTEST CORP11 citations77
US7216271B2May 8, 2007

Testing apparatus and a testing method

ADVANTEST CORP9 citations74
US6651179B1Nov 18, 2003

Delay time judging apparatus

ADVANTEST CORP8 citations74

SONY CORP

6 patents

SATO SHINYA

3 patents

HINO MOTORS LTD

2 patents

HITACHI LTD

2 patents

TOSHIBA KK

2 patents

SEIKO EPSON CORP

2 patents

CKD CORP

2 patents

OLYMPUS CORP

2 patents

DAINIPPON PRINTING CO LTD

1 patent

TASHIRO NAOYUKI

1 patent

SONY SEMICONDUCTOR SOLUTIONS CORP

1 patent

TOYOTA JIDOSHOKKI KK

1 patent

HOSOYA MITSURU

1 patent

HONDA MOTOR CO LTD

1 patent

HITACHI ASTEMO LTD

1 patent

HITACHI CONSTRUCTION MACH CO

1 patent

PANASONIC CORP

1 patent

Showing the top 50 of 139 patents by PatentIndex Score.