Inventor
NEEB JAMES E
US5 patents
⚠️ This page may combine multiple inventors who share the name “NEEB JAMES E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
4 patentsUS6766486B2Jul 20, 2004
Joint test action group (JTAG) tester, such as to test integrated circuits in parallel
INTEL CORP27 citations89
US6441637B1Aug 27, 2002
Apparatus and method for power continuity testing in a parallel testing system
INTEL CORP19 citations89
US9869714B2Jan 16, 2018
Integrated circuit test temperature control mechanism
INTEL CORP9 citations83
US6559673B2May 6, 2003
Apparatus and method for power continuity testing in a parallel testing system
INTEL CORP5 citations70