Inventor
PRAMANIK DIPANKAR
US127 patents
⚠️ This page may combine multiple inventors who share the name “PRAMANIK DIPANKAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
VLSI TECHNOLOGY INC
16 patentsUS5493146AFeb 20, 1996
Anti-fuse structure for reducing contamination of the anti-fuse material
VLSI TECHNOLOGY INC77 citations96
US5834356ANov 10, 1998
Method of making high resistive structures in salicided process semiconductor devices
VLSI TECHNOLOGY INC42 citations93
US5522957AJun 4, 1996
Method for leak detection in etching chambers
VLSI TECHNOLOGY INC28 citations93
US5436410AJul 25, 1995
Method and structure for suppressing stress-induced defects in integrated circuit conductive lines
VLSI TECHNOLOGY INC21 citations93
US5399533AMar 21, 1995
Method improving integrated circuit planarization during etchback
VLSI TECHNOLOGY INC41 citations93
US6176983B1Jan 23, 2001
Methods of forming a semiconductor device
VLSI TECHNOLOGY INC32 citations92
US5852497ADec 22, 1998
Method and apparatus for detecting edges under an opaque layer
VLSI TECHNOLOGY INC18 citations92
US5573970ANov 12, 1996
Method for reducing contamination of anti-fuse material in an anti-fuse structure
VLSI TECHNOLOGY INC19 citations92
US5128279AJul 7, 1992
Charge neutralization using silicon-enriched oxide layer
VLSI TECHNOLOGY INC30 citations92
US5057897AOct 15, 1991
Charge neutralization using silicon-enriched oxide layer
VLSI TECHNOLOGY INC49 citations92
US5811346ASep 22, 1998
Silicon corner rounding in shallow trench isolation process
VLSI TECHNOLOGY INC20 citations91
US5290727AMar 1, 1994
Method for suppressing charge loss in EEPROMs/EPROMS and instabilities in SRAM load resistors
VLSI TECHNOLOGY INC26 citations89
USRE36893EOct 3, 2000
Anti-fuse structure for reducing contamination of the anti-fuse material
VLSI TECHNOLOGY INC7 citations74
US5763937AJun 9, 1998
Device reliability of MOS devices using silicon rich plasma oxide films
VLSI TECHNOLOGY INC16 citations74
US5602056AFeb 11, 1997
Method for forming reliable MOS devices using silicon rich plasma oxide film
VLSI TECHNOLOGY INC12 citations74
US5496774AMar 5, 1996
Method improving integrated circuit planarization during etchback
VLSI TECHNOLOGY INC17 citations74
INTERMOLECULAR INC
11 patentsUS9076523B2Jul 7, 2015
Methods of manufacturing embedded bipolar switching resistive memory
INTERMOLECULAR INC25 citations92
US9246092B1Jan 26, 2016
Tunneling barrier creation in MSM stack as a selector device for non-volatile memory application
INTERMOLECULAR INC8 citations84
US9240236B1Jan 19, 2016
Switching conditions for resistive random access memory cells
INTERMOLECULAR INC8 citations84
US9177916B1Nov 3, 2015
Amorphous silicon doped with fluorine for selectors of resistive random access memory cells
INTERMOLECULAR INC14 citations84
US9054307B2Jun 9, 2015
Resistive random access memory cells having metal alloy current limiting layers
INTERMOLECULAR INC6 citations84
US9025360B2May 5, 2015
Method for improving data retention of ReRAM chips operating at low operating temperatures
INTERMOLECULAR INC6 citations84
US9012260B2Apr 21, 2015
Controlling ReRam forming voltage with doping
INTERMOLECULAR INC8 citations84
US8981332B2Mar 17, 2015
Nonvolatile resistive memory element with an oxygen-gettering layer
INTERMOLECULAR INC10 citations84
US8907313B2Dec 9, 2014
Controlling ReRam forming voltage with doping
INTERMOLECULAR INC6 citations84
US8817524B2Aug 26, 2014
Resistive random access memory cells having metal alloy current limiting layers
INTERMOLECULAR INC11 citations84
US8735217B2May 27, 2014
Multifunctional electrode
INTERMOLECULAR INC4 citations84
SYNOPSYS INC
9 patentsUS7895548B2Feb 22, 2011
Filler cells for design optimization in a place-and-route system
SYNOPSYS INC128 citations98
US6928635B2Aug 9, 2005
Selectively applying resolution enhancement techniques to improve performance and manufacturing cost of integrated circuits
SYNOPSYS INC236 citations97
US7484198B2Jan 27, 2009
Managing integrated circuit stress using dummy diffusion regions
SYNOPSYS INC48 citations96
US6931617B2Aug 16, 2005
Mask cost driven logic optimization and synthesis
SYNOPSYS INC227 citations95
US7897479B2Mar 1, 2011
Managing integrated circuit stress using dummy diffusion regions
SYNOPSYS INC18 citations93
US7600207B2Oct 6, 2009
Stress-managed revision of integrated circuit layouts
SYNOPSYS INC24 citations93
US7542891B2Jun 2, 2009
Method of correlating silicon stress to device instance parameters for circuit simulation
SYNOPSYS INC40 citations93
US7767515B2Aug 3, 2010
Managing integrated circuit stress using stress adjustment trenches
SYNOPSYS INC18 citations84
US9465897B2Oct 11, 2016
Analysis of stress impact on transistor performance
SYNOPSYS INC2 citations74
MOROZ VICTOR
4 patentsUS8407634B1Mar 26, 2013
Analysis of stress impact on transistor performance
MOROZ VICTOR10 citations93
US8069430B2Nov 29, 2011
Stress-managed revision of integrated circuit layouts
MOROZ VICTOR8 citations84
US8661398B1Feb 25, 2014
Analysis of stress impact on transistor performance
MOROZ VICTOR2 citations74
US8615728B2Dec 24, 2013
Analysis of stress impact on transistor performance
MOROZ VICTOR4 citations74
PRAMANIK DIPANKAR
3 patentsUS8466005B2Jun 18, 2013
Method for forming metal oxides and silicides in a memory device
PRAMANIK DIPANKAR23 citations92
US8803124B2Aug 12, 2014
Creating an embedded reram memory from a high-K metal gate transistor structure
PRAMANIK DIPANKAR5 citations83
US8572517B2Oct 29, 2013
System and method for modifying a data set of a photomask
PRAMANIK DIPANKAR9 citations81
WANG YUN
2 patentsLIN XI-WEI
2 patentsKONINKL PHILIPS ELECTRONICS NV
1 patent(unassigned)
1 patentCADENCE DESIGN SYSTEMS INC
1 patentShowing the top 50 of 127 patents by PatentIndex Score.