P

Inventor

PRAMANIK DIPANKAR

US127 patents
⚠️ This page may combine multiple inventors who share the name “PRAMANIK DIPANKAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

VLSI TECHNOLOGY INC

16 patents
US5493146AFeb 20, 1996

Anti-fuse structure for reducing contamination of the anti-fuse material

VLSI TECHNOLOGY INC77 citations96
US5834356ANov 10, 1998

Method of making high resistive structures in salicided process semiconductor devices

VLSI TECHNOLOGY INC42 citations93
US5522957AJun 4, 1996

Method for leak detection in etching chambers

VLSI TECHNOLOGY INC28 citations93
US5436410AJul 25, 1995

Method and structure for suppressing stress-induced defects in integrated circuit conductive lines

VLSI TECHNOLOGY INC21 citations93
US5399533AMar 21, 1995

Method improving integrated circuit planarization during etchback

VLSI TECHNOLOGY INC41 citations93
US6176983B1Jan 23, 2001

Methods of forming a semiconductor device

VLSI TECHNOLOGY INC32 citations92
US5852497ADec 22, 1998

Method and apparatus for detecting edges under an opaque layer

VLSI TECHNOLOGY INC18 citations92
US5573970ANov 12, 1996

Method for reducing contamination of anti-fuse material in an anti-fuse structure

VLSI TECHNOLOGY INC19 citations92
US5128279AJul 7, 1992

Charge neutralization using silicon-enriched oxide layer

VLSI TECHNOLOGY INC30 citations92
US5057897AOct 15, 1991

Charge neutralization using silicon-enriched oxide layer

VLSI TECHNOLOGY INC49 citations92
US5811346ASep 22, 1998

Silicon corner rounding in shallow trench isolation process

VLSI TECHNOLOGY INC20 citations91
US5290727AMar 1, 1994

Method for suppressing charge loss in EEPROMs/EPROMS and instabilities in SRAM load resistors

VLSI TECHNOLOGY INC26 citations89
USRE36893EOct 3, 2000

Anti-fuse structure for reducing contamination of the anti-fuse material

VLSI TECHNOLOGY INC7 citations74
US5763937AJun 9, 1998

Device reliability of MOS devices using silicon rich plasma oxide films

VLSI TECHNOLOGY INC16 citations74
US5602056AFeb 11, 1997

Method for forming reliable MOS devices using silicon rich plasma oxide film

VLSI TECHNOLOGY INC12 citations74
US5496774AMar 5, 1996

Method improving integrated circuit planarization during etchback

VLSI TECHNOLOGY INC17 citations74

INTERMOLECULAR INC

11 patents

SYNOPSYS INC

9 patents

MOROZ VICTOR

4 patents

PRAMANIK DIPANKAR

3 patents

WANG YUN

2 patents

LIN XI-WEI

2 patents

KONINKL PHILIPS ELECTRONICS NV

1 patent

(unassigned)

1 patent

CADENCE DESIGN SYSTEMS INC

1 patent

Showing the top 50 of 127 patents by PatentIndex Score.