Inventor
PAKDAMAN NADER
US20 patents
⚠️ This page may combine multiple inventors who share the name “PAKDAMAN NADER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAU METRIX INC
9 patentsUS8344745B2Jan 1, 2013
Test structures for evaluating a fabrication of a die or a wafer
TAU METRIX INC90 citations98
US7736916B2Jun 15, 2010
System and apparatus for using test structures inside of a chip during the fabrication of the chip
TAU METRIX INC97 citations98
US7256055B2Aug 14, 2007
System and apparatus for using test structures inside of a chip during the fabrication of the chip
TAU METRIX INC134 citations98
US7220990B2May 22, 2007
Technique for evaluating a fabrication of a die and wafer
TAU METRIX INC59 citations97
US7730434B2Jun 1, 2010
Contactless technique for evaluating a fabrication of a wafer
TAU METRIX INC24 citations95
US7423288B2Sep 9, 2008
Technique for evaluating a fabrication of a die and wafer
TAU METRIX INC26 citations95
US7339388B2Mar 4, 2008
Intra-clip power and test signal generation for use with test structures on wafers
TAU METRIX INC25 citations95
US7605597B2Oct 20, 2009
Intra-chip power and test signal generation for use with test structures on wafers
TAU METRIX INC18 citations92
US7723724B2May 25, 2010
System for using test structures to evaluate a fabrication of a wafer
TAU METRIX INC4 citations73
CREDENCE SYSTEMS CORP
5 patentsUS6778327B2Aug 17, 2004
Bi-convex solid immersion lens
CREDENCE SYSTEMS CORP33 citations96
US6836131B2Dec 28, 2004
Spray cooling and transparent cooling plate thermal management system
CREDENCE SYSTEMS CORP58 citations95
US6859031B2Feb 22, 2005
Apparatus and method for dynamic diagnostic testing of integrated circuits
CREDENCE SYSTEMS CORP79 citations94
US7224828B2May 29, 2007
Time resolved non-invasive diagnostics system
CREDENCE SYSTEMS CORP27 citations91
US7227702B2Jun 5, 2007
Bi-convex solid immersion lens
CREDENCE SYSTEMS CORP9 citations74