Inventor
STEINBRUECK GARY L
US10 patents
⚠️ This page may combine multiple inventors who share the name “STEINBRUECK GARY L”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAU METRIX INC
9 patentsUS8344745B2Jan 1, 2013
Test structures for evaluating a fabrication of a die or a wafer
TAU METRIX INC90 citations98
US7736916B2Jun 15, 2010
System and apparatus for using test structures inside of a chip during the fabrication of the chip
TAU METRIX INC97 citations98
US7256055B2Aug 14, 2007
System and apparatus for using test structures inside of a chip during the fabrication of the chip
TAU METRIX INC134 citations98
US7220990B2May 22, 2007
Technique for evaluating a fabrication of a die and wafer
TAU METRIX INC59 citations97
US7730434B2Jun 1, 2010
Contactless technique for evaluating a fabrication of a wafer
TAU METRIX INC24 citations95
US7423288B2Sep 9, 2008
Technique for evaluating a fabrication of a die and wafer
TAU METRIX INC26 citations95
US7339388B2Mar 4, 2008
Intra-clip power and test signal generation for use with test structures on wafers
TAU METRIX INC25 citations95
US7605597B2Oct 20, 2009
Intra-chip power and test signal generation for use with test structures on wafers
TAU METRIX INC18 citations92
US7723724B2May 25, 2010
System for using test structures to evaluate a fabrication of a wafer
TAU METRIX INC4 citations73