P

Inventor

ZHENG HUA

CN115 patents
⚠️ This page may combine multiple inventors who share the name “ZHENG HUA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

33 patents
US6665222B2Dec 16, 2003

Synchronous dynamic random access memory device

MICRON TECHNOLOGY INC106 citations99
US6172935B1Jan 9, 2001

Synchronous dynamic random access memory device

MICRON TECHNOLOGY INC123 citations99
US5627791AMay 6, 1997

Multiple bank memory with auto refresh to specified bank

MICRON TECHNOLOGY INC302 citations99
US6365421B2Apr 2, 2002

Method and apparatus for storage of test results within an integrated circuit

MICRON TECHNOLOGY INC118 citations98
US6194738B1Feb 27, 2001

Method and apparatus for storage of test results within an integrated circuit

MICRON TECHNOLOGY INC102 citations97
US6550026B1Apr 15, 2003

High speed test system for a memory device

MICRON TECHNOLOGY INC68 citations96
US6373752B1Apr 16, 2002

Synchronous dynamic random access memory device

MICRON TECHNOLOGY INC33 citations96
US6190972B1Feb 20, 2001

Method for storing information in a semiconductor device

MICRON TECHNOLOGY INC55 citations96
US6154860ANov 28, 2000

High-speed test system for a memory device

MICRON TECHNOLOGY INC63 citations96
US6011742AJan 4, 2000

Shared pull-up and selection circuitry for programmable cells such as antifuse cells

MICRON TECHNOLOGY INC41 citations96
US5999481ADec 7, 1999

Method and apparatus for controlling the operation of an integrated circuit responsive to out-of-synchronism control signals

MICRON TECHNOLOGY INC62 citations96
US5966388AOct 12, 1999

High-speed test system for a memory device

MICRON TECHNOLOGY INC80 citations96
US5895962AApr 20, 1999

Structure and a method for storing information in a semiconductor device

MICRON TECHNOLOGY INC69 citations96
US5883853AMar 16, 1999

Clock frequency detector for a synchronous memory device

MICRON TECHNOLOGY INC47 citations96
US5673233ASep 30, 1997

Synchronous memory allowing early read command in write to read transitions

MICRON TECHNOLOGY INC72 citations96
US5587961ADec 24, 1996

Synchronous memory allowing early read command in write to read transitions

MICRON TECHNOLOGY INC52 citations96
US6496027B1Dec 17, 2002

System for testing integrated circuit devices

MICRON TECHNOLOGY INC50 citations95
US6512711B1Jan 28, 2003

Synchronous dynamic random access memory device

MICRON TECHNOLOGY INC22 citations93
US6351404B1Feb 26, 2002

Synchronous dynamic random access memory device

MICRON TECHNOLOGY INC26 citations93
US6310819B1Oct 30, 2001

Method and apparatus for controlling the operation of an integrated circuit responsive to out-of-synchronism control signals

MICRON TECHNOLOGY INC25 citations93
US6229749B1May 8, 2001

Method and apparatus for controlling the operation of an integrated circuit responsive to out-of-synchronism control signals

MICRON TECHNOLOGY INC23 citations93
US6215709B1Apr 10, 2001

Synchronous dynamic random access memory device

MICRON TECHNOLOGY INC23 citations93
US6141290AOct 31, 2000

Method and apparatus for controlling the operation of an integrated circuit responsive to out-of-synchronism control signals

MICRON TECHNOLOGY INC24 citations93
US6044027AMar 28, 2000

Circuit and method for providing a substantially constant time delay over a range of supply voltages

MICRON TECHNOLOGY INC36 citations93
US5978298ANov 2, 1999

Shared pull-up and selection circuitry for programmable cells such as antifuse cells

MICRON TECHNOLOGY INC27 citations93
US5875144AFeb 23, 1999

Shared pull-up and selection circuitry for programmable cells such as antifuse cells

MICRON TECHNOLOGY INC21 citations93
US5805505ASep 8, 1998

Circuit and method for converting a pair of input signals into a level-limited output signal

MICRON TECHNOLOGY INC38 citations93
US5796266AAug 18, 1998

Circuit and a method for configuring pad connections in an integrated device

MICRON TECHNOLOGY INC20 citations93
US5748542AMay 5, 1998

Circuit and method for providing a substantially constant time delay over a range of supply voltages

MICRON TECHNOLOGY INC24 citations93
US6930503B2Aug 16, 2005

System for testing integrated circuit devices

MICRON TECHNOLOGY INC28 citations91
US6756805B2Jun 29, 2004

System for testing integrated circuit devices

MICRON TECHNOLOGY INC23 citations91
US6212111B1Apr 3, 2001

Synchronous dynamic random access memory device

MICRON TECHNOLOGY INC13 citations82
US6133053AOct 17, 2000

Circuit and a method for configuring pad connections in an integrated device

MICRON TECHNOLOGY INC12 citations82

WINBOND ELECTRONICS CORP

8 patents

MICRON TECHNOLOGY CORP

2 patents

LILLY CO ELI

2 patents

WINBOND ELECTRONICS CORP AMERI

1 patent

SHENZHEN CHINA STAR OPTOELECT

1 patent

LI HANG

1 patent

KILAR JASON A

1 patent

WEI XUAN

1 patent

Showing the top 50 of 115 patents by PatentIndex Score.