Inventor
ZHENG HUA
CN115 patents
⚠️ This page may combine multiple inventors who share the name “ZHENG HUA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
33 patentsUS6665222B2Dec 16, 2003
Synchronous dynamic random access memory device
MICRON TECHNOLOGY INC106 citations99
US6172935B1Jan 9, 2001
Synchronous dynamic random access memory device
MICRON TECHNOLOGY INC123 citations99
US5627791AMay 6, 1997
Multiple bank memory with auto refresh to specified bank
MICRON TECHNOLOGY INC302 citations99
US6365421B2Apr 2, 2002
Method and apparatus for storage of test results within an integrated circuit
MICRON TECHNOLOGY INC118 citations98
US6194738B1Feb 27, 2001
Method and apparatus for storage of test results within an integrated circuit
MICRON TECHNOLOGY INC102 citations97
US6550026B1Apr 15, 2003
High speed test system for a memory device
MICRON TECHNOLOGY INC68 citations96
US6373752B1Apr 16, 2002
Synchronous dynamic random access memory device
MICRON TECHNOLOGY INC33 citations96
US6190972B1Feb 20, 2001
Method for storing information in a semiconductor device
MICRON TECHNOLOGY INC55 citations96
US6154860ANov 28, 2000
High-speed test system for a memory device
MICRON TECHNOLOGY INC63 citations96
US6011742AJan 4, 2000
Shared pull-up and selection circuitry for programmable cells such as antifuse cells
MICRON TECHNOLOGY INC41 citations96
US5999481ADec 7, 1999
Method and apparatus for controlling the operation of an integrated circuit responsive to out-of-synchronism control signals
MICRON TECHNOLOGY INC62 citations96
US5966388AOct 12, 1999
High-speed test system for a memory device
MICRON TECHNOLOGY INC80 citations96
US5895962AApr 20, 1999
Structure and a method for storing information in a semiconductor device
MICRON TECHNOLOGY INC69 citations96
US5883853AMar 16, 1999
Clock frequency detector for a synchronous memory device
MICRON TECHNOLOGY INC47 citations96
US5673233ASep 30, 1997
Synchronous memory allowing early read command in write to read transitions
MICRON TECHNOLOGY INC72 citations96
US5587961ADec 24, 1996
Synchronous memory allowing early read command in write to read transitions
MICRON TECHNOLOGY INC52 citations96
US6496027B1Dec 17, 2002
System for testing integrated circuit devices
MICRON TECHNOLOGY INC50 citations95
US6512711B1Jan 28, 2003
Synchronous dynamic random access memory device
MICRON TECHNOLOGY INC22 citations93
US6351404B1Feb 26, 2002
Synchronous dynamic random access memory device
MICRON TECHNOLOGY INC26 citations93
US6310819B1Oct 30, 2001
Method and apparatus for controlling the operation of an integrated circuit responsive to out-of-synchronism control signals
MICRON TECHNOLOGY INC25 citations93
US6229749B1May 8, 2001
Method and apparatus for controlling the operation of an integrated circuit responsive to out-of-synchronism control signals
MICRON TECHNOLOGY INC23 citations93
US6215709B1Apr 10, 2001
Synchronous dynamic random access memory device
MICRON TECHNOLOGY INC23 citations93
US6141290AOct 31, 2000
Method and apparatus for controlling the operation of an integrated circuit responsive to out-of-synchronism control signals
MICRON TECHNOLOGY INC24 citations93
US6044027AMar 28, 2000
Circuit and method for providing a substantially constant time delay over a range of supply voltages
MICRON TECHNOLOGY INC36 citations93
US5978298ANov 2, 1999
Shared pull-up and selection circuitry for programmable cells such as antifuse cells
MICRON TECHNOLOGY INC27 citations93
US5875144AFeb 23, 1999
Shared pull-up and selection circuitry for programmable cells such as antifuse cells
MICRON TECHNOLOGY INC21 citations93
US5805505ASep 8, 1998
Circuit and method for converting a pair of input signals into a level-limited output signal
MICRON TECHNOLOGY INC38 citations93
US5796266AAug 18, 1998
Circuit and a method for configuring pad connections in an integrated device
MICRON TECHNOLOGY INC20 citations93
US5748542AMay 5, 1998
Circuit and method for providing a substantially constant time delay over a range of supply voltages
MICRON TECHNOLOGY INC24 citations93
US6930503B2Aug 16, 2005
System for testing integrated circuit devices
MICRON TECHNOLOGY INC28 citations91
US6756805B2Jun 29, 2004
System for testing integrated circuit devices
MICRON TECHNOLOGY INC23 citations91
US6212111B1Apr 3, 2001
Synchronous dynamic random access memory device
MICRON TECHNOLOGY INC13 citations82
US6133053AOct 17, 2000
Circuit and a method for configuring pad connections in an integrated device
MICRON TECHNOLOGY INC12 citations82
WINBOND ELECTRONICS CORP
8 patentsUS6195303B1Feb 27, 2001
Clock-based transparent refresh mechanisms for DRAMS
WINBOND ELECTRONICS CORP58 citations96
US6061292AMay 9, 2000
Method and circuit for triggering column select line for write operations
WINBOND ELECTRONICS CORP53 citations94
US6480428B2Nov 12, 2002
Redundant circuit for memory device
WINBOND ELECTRONICS CORP42 citations93
US6157560ADec 5, 2000
Memory array datapath architecture
WINBOND ELECTRONICS CORP35 citations93
US6144610ANov 7, 2000
Distributed circuits to turn off word lines in a memory array
WINBOND ELECTRONICS CORP24 citations91
US6097640AAug 1, 2000
Memory and circuit for accessing data bits in a memory array in multi-data rate operation
WINBOND ELECTRONICS CORP20 citations91
US6188624B1Feb 13, 2001
Low latency memory sensing circuits
WINBOND ELECTRONICS CORP18 citations84
US6452843B1Sep 17, 2002
Method and apparatus for testing high-speed circuits based on slow-speed signals
WINBOND ELECTRONICS CORP15 citations82
MICRON TECHNOLOGY CORP
2 patentsLILLY CO ELI
2 patentsWINBOND ELECTRONICS CORP AMERI
1 patentSHENZHEN CHINA STAR OPTOELECT
1 patentLI HANG
1 patentKILAR JASON A
1 patentWEI XUAN
1 patentShowing the top 50 of 115 patents by PatentIndex Score.