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Inventor
MATINPOUR BABAK
US
2 patents
Patents
2 patents
US7994807B1
Aug 9, 2011
Built-in test circuit for testing AC transfer characteristic of high-speed analog circuit
NAT SEMICONDUCTOR CORP
17 citations
81
US7649409B1
Jan 19, 2010
All-pass termination network with equalization and wide common-mode range
NAT SEMICONDUCTOR CORP
17 citations
80