Inventor
VAN DUINEN GIJS
NL4 patents
Patents
4 patentsUS9136087B2Sep 15, 2015
Method of investigating and correcting aberrations in a charged-particle lens system
FEI CO3 citations59
US9202670B2Dec 1, 2015
Method of investigating the wavefront of a charged-particle beam
FEI CO3 citations57
US10651007B2May 12, 2020
Cryogenic cell for mounting a specimen in a charged particle microscope
FEI CO0 citations39
US9583303B2Feb 28, 2017
Aligning a featureless thin film in a TEM
FEI CO0 citations38