Inventor
URANO TAKAHIRO
JP14 patents
⚠️ This page may combine multiple inventors who share the name “URANO TAKAHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
10 patentsUS9778206B2Oct 3, 2017
Defect inspection device and defect inspection method
HITACHI HIGH TECH CORP16 citations84
US9865046B2Jan 9, 2018
Defect inspection method and defect inspection device
HITACHI HIGH TECH CORP7 citations83
US12039716B2Jul 16, 2024
Defect inspection method and defect inspection device
HITACHI HIGH TECH CORP2 citations71
US11788973B2Oct 17, 2023
Defect inspection device and defect inspection method
HITACHI HIGH TECH CORP2 citations71
US10861145B2Dec 8, 2020
Defect inspection device and defect inspection method
HITACHI HIGH TECH CORP4 citations71
US10466181B2Nov 5, 2019
Flaw inspection device and flaw inspection method
HITACHI HIGH TECH CORP1 citations61
US11041815B2Jun 22, 2021
Inspection information generation device, inspection information generation method, and defect inspection device
HITACHI HIGH TECH CORP0 citations51
US12235223B2Feb 25, 2025
Method for defect inspection, system, and computer-readable medium
HITACHI HIGH TECH CORP0 citations50
US12112963B2Oct 8, 2024
Defect inspection apparatus and defect inspection program
HITACHI HIGH TECH CORP0 citations50
US10816484B2Oct 27, 2020
Flaw inspection device and flaw inspection method
HITACHI HIGH TECH CORP0 citations50