P

Inventor

TAKEMURA FUMIHIRO

JP11 patents
⚠️ This page may combine multiple inventors who share the name “TAKEMURA FUMIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITUTOYO CORP

7 patents
US6671973B2Jan 6, 2004

Surface texture measuring instrument and a method of adjusting an attitude of a work for the same

MITUTOYO CORP38 citations91
US9442054B2Sep 13, 2016

Hardness tester having offset correction feature

MITUTOYO CORP3 citations71
US9417171B2Aug 16, 2016

Hardness tester

MITUTOYO CORP3 citations71
US7277818B2Oct 2, 2007

Method and program for leveling aspherical workpieces

MITUTOYO CORP7 citations70
US7142313B2Nov 28, 2006

Interaxis angle correction method

MITUTOYO CORP4 citations59
US11221201B2Jan 11, 2022

Profile measuring machine and profile measuring method

MITUTOYO CORP0 citations51
US7096149B2Aug 22, 2006

Method for determining coordinate system for device under measurement, and coordinate measuring apparatus

MITUTOYO CORP0 citations37

TAKEMURA FUMIHIRO

2 patents
US8578284B2Nov 5, 2013

Hardness testing device with a user interface for setting test locations

TAKEMURA FUMIHIRO10 citations81
US8566735B2Oct 22, 2013

Hardness tester with a user interface for setting test locations

TAKEMURA FUMIHIRO8 citations81

MATSUMIYA SADAYUKI

1 patent
US8650939B2Feb 18, 2014

Surface texture measuring machine and a surface texture measuring method

MATSUMIYA SADAYUKI5 citations70

FUKUMOTO YASUSHI

1 patent
US8654351B2Feb 18, 2014

Offset amount calibrating method and surface profile measuring machine

FUKUMOTO YASUSHI2 citations53