P

Inventor

BAN NAOMA

JP9 patents
⚠️ This page may combine multiple inventors who share the name “BAN NAOMA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI HIGH TECH CORP

5 patents
US10832886B2Nov 10, 2020

Beam irradiation device

HITACHI HIGH TECH CORP3 citations72
US11056310B2Jul 6, 2021

Charged-particle beam device

HITACHI HIGH TECH CORP4 citations71
US9177757B2Nov 3, 2015

Charged particle beam apparatus

HITACHI HIGH TECH CORP3 citations62
US11239042B2Feb 1, 2022

Beam irradiation device

HITACHI HIGH TECH CORP0 citations61
US8013299B2Sep 6, 2011

Review method and review device

HITACHI HIGH TECH CORP1 citations51

TAKADA SATOSHI

1 patent
US8519334B2Aug 27, 2013

Scanning electron microscope and sample observation method

TAKADA SATOSHI16 citations76

TSUJI HIROSHI

1 patent
US8125647B2Feb 28, 2012

Charged particle beam apparatus and displacement detecting circuit

TSUJI HIROSHI0 citations49

BAN NAOMA

1 patent
US8878925B2Nov 4, 2014

Observation method and observation device

BAN NAOMA1 citations44

HIRAI TAKEHIRO

1 patent
US9136189B2Sep 15, 2015

Surface observation apparatus and surface observation method

HIRAI TAKEHIRO0 citations40