Inventor

SOETARMAN RONNY

US29 patents

⚠️ This page may combine multiple inventors who share the name “SOETARMAN RONNY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SOETARMAN RONNY

ZETA INSTR INC

Multi-surface specular reflection inspector

Method of detecting defect location using multi-surface specular reflection

Optical measurement of opening dimensions in a wafer

Optical measurement of bump hieght

Method and apparatus to detect defects in transparent solids

Method and apparatus to optically detect defects in transparent solids

3D microscope and methods of measuring patterned substrates

Dual mode inspector

Optical measurement of step size and plated metal thickness

KLA TENCOR CORP

Wafer edge inspection

Surface finish roughness measurement

3D microscope including insertable components to provide multiple imaging and measurement capabilities

3D microscope including insertable components to provide multiple imaging and measurement capabilities

3D microscope including insertable components to provide multiple imaging and measurement capabilities

3D microscope including insertable components to provide multiple imaging and measurement capabilities

CANDELA INSTR

System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operations

System and method for measuring thin film properties and analyzing two-dimensional histograms using substraction operation

System and method for measuring thin film properties and analyzing two-dimensional histograms using a symmetry operation

System and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughness

SCHLUMBERGER TECHNOLOGIES INC

Optimal probe point placement

Method of probing a net of an IC at an optimal probe-point

KLA TENCOR TECH CORP

Wafer edge inspection

Servo pattern characterization on magnetic disks

XU JAMES JIANGUO

3D microscope including insertable components to provide multiple imaging and measurement capabilities

System and method for monitoring LED chip surface roughening process

CANDELA INSTR INC

High temperature thin film property measurement system and method

HOU ZHEN

3D microscope and methods of measuring patterned substrates

LEE KEN KINSUN

Multi-surface optical 3D microscope

KLA TENCOR TECHNOLOGUES CORP

System and method for automatically determining magnetic eccentricity of a disk